Hey guys have been running unRaid for about 3 months and love it. I just checked my unmenu and saw a Multi_Zone_Error_Rate of 30. I have enclosed my smart report. Im using the SAMSUNG HD204UI with the new firmware and unraid 4.7 with 4k mbr. Should I be concerned about health of drive? Thank for the help this forum is a wealth of knowledge.

 

 

Statistics for /dev/sdc SAMSUNG_HD204UI_S2H7J1BZA28925

smartctl -a -d ata /dev/sdc

smartctl version 5.38 [i486-slackware-linux-gnu] Copyright © 2002-8 Bruce Allen

Home page is http://smartmontools.sourceforge.net/

 

=== START OF INFORMATION SECTION ===

Device Model:    SAMSUNG HD204UI

Serial Number:    S2H7J1BZA28925

Firmware Version: 1AQ10001

User Capacity:    2,000,398,934,016 bytes

Device is:        In smartctl database [for details use: -P show]

ATA Version is:  8

ATA Standard is:  Not recognized. Minor revision code: 0x28

Local Time is:    Tue Feb  1 00:30:39 2011 EST

 

==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details.

 

SMART support is: Available - device has SMART capability.

SMART support is: Enabled

 

=== START OF READ SMART DATA SECTION ===

SMART overall-health self-assessment test result: PASSED

 

General SMART Values:

Offline data collection status:  (0x00) Offline data collection activity

was never started.

Auto Offline Data Collection: Disabled.

Self-test execution status:      ( 247) Self-test routine in progress...

70% of test remaining.

Total time to complete Offline

data collection: (19680) seconds.

Offline data collection

capabilities: (0x5b) SMART execute Offline immediate.

Auto Offline data collection on/off support.

Suspend Offline collection upon new

command.

Offline surface scan supported.

Self-test supported.

No Conveyance Self-test supported.

Selective Self-test supported.

SMART capabilities:            (0x0003) Saves SMART data before entering

power-saving mode.

Supports SMART auto save timer.

Error logging capability:        (0x01) Error logging supported.

General Purpose Logging supported.

Short self-test routine

recommended polling time: (  2) minutes.

Extended self-test routine

recommended polling time: ( 255) minutes.

SCT capabilities:       (0x003f) SCT Status supported.

SCT Feature Control supported.

SCT Data Table supported.

 

SMART Attributes Data Structure revision number: 16

Vendor Specific SMART Attributes with Thresholds:

ID# ATTRIBUTE_NAME          FLAG    VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE

  1 Raw_Read_Error_Rate    0x002f  100  100  051    Pre-fail  Always      -      5

  2 Throughput_Performance  0x0026  252  252  000    Old_age  Always      -      0

  3 Spin_Up_Time            0x0023  066  064  025    Pre-fail  Always      -      10458

  4 Start_Stop_Count        0x0032  100  100  000    Old_age  Always      -      249

  5 Reallocated_Sector_Ct  0x0033  252  252  010    Pre-fail  Always      -      0

  7 Seek_Error_Rate        0x002e  252  252  051    Old_age  Always      -      0

  8 Seek_Time_Performance  0x0024  252  252  015    Old_age  Offline      -      0

  9 Power_On_Hours          0x0032  100  100  000    Old_age  Always      -      389

10 Spin_Retry_Count        0x0032  252  252  051    Old_age  Always      -      0

11 Calibration_Retry_Count 0x0032  252  252  000    Old_age  Always      -      0

12 Power_Cycle_Count      0x0032  100  100  000    Old_age  Always      -      42

181 Unknown_Attribute      0x0022  100  100  000    Old_age  Always      -      14258524

191 G-Sense_Error_Rate      0x0022  100  100  000    Old_age  Always      -      2094

192 Power-Off_Retract_Count 0x0022  252  252  000    Old_age  Always      -      0

194 Temperature_Celsius    0x0002  064  059  000    Old_age  Always      -      30 (Lifetime Min/Max 17/41)

195 Hardware_ECC_Recovered  0x003a  100  100  000    Old_age  Always      -      0

196 Reallocated_Event_Count 0x0032  252  252  000    Old_age  Always      -      0

197 Current_Pending_Sector  0x0032  252  252  000    Old_age  Always      -      0

198 Offline_Uncorrectable  0x0030  252  252  000    Old_age  Offline      -      0

199 UDMA_CRC_Error_Count    0x0036  100  100  000    Old_age  Always      -      2

200 Multi_Zone_Error_Rate  0x002a  100  100  000    Old_age  Always      -      30

223 Load_Retry_Count        0x0032  252  252  000    Old_age  Always      -      0

225 Load_Cycle_Count        0x0032  100  100  000    Old_age  Always      -      258

 

SMART Error Log Version: 1

ATA Error Count: 1

CR = Command Register [HEX]

FR = Features Register [HEX]

SC = Sector Count Register [HEX]

SN = Sector Number Register [HEX]

CL = Cylinder Low Register [HEX]

CH = Cylinder High Register [HEX]

DH = Device/Head Register [HEX]

DC = Device Command Register [HEX]

ER = Error register [HEX]

ST = Status register [HEX]

Powered_Up_Time is measured from power on, and printed as

DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,

SS=sec, and sss=millisec. It "wraps" after 49.710 days.

 

Error 1 occurred at disk power-on lifetime: 310 hours (12 days + 22 hours)

  When the command that caused the error occurred, the device was active or idle.

 

  After command completion occurred, registers were:

  ER ST SC SN CL CH DH

  -- -- -- -- -- -- --

  84 51 87 80 cf 98 e0  Error: ICRC, ABRT 135 sectors at LBA = 0x0098cf80 = 10014592

 

  Commands leading to the command that caused the error were:

  CR FR SC SN CL CH DH DC  Powered_Up_Time  Command/Feature_Name

  -- -- -- -- -- -- -- --  ----------------  --------------------

  c8 00 00 07 cf 98 e0 0a      00:00:00.515  READ DMA

  25 00 18 ef cd 98 e0 0a      00:00:00.515  READ DMA EXT

  25 00 b0 3f cc 98 e0 0a      00:00:00.515  READ DMA EXT

  25 00 38 07 cb 98 e0 0a      00:00:00.515  READ DMA EXT

  c8 00 78 8f ca 98 e0 0a      00:00:00.515  READ DMA

 

SMART Self-test log structure revision number 1

Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error

# 1  Short offline      Completed without error      00%      380        -

# 2  Short offline      Completed without error      00%      325        -

# 3  Short offline      Aborted by host              60%      325        -

# 4  Short offline      Interrupted (host reset)      80%      311        -

# 5  Short offline      Completed without error      00%      307        -

# 6  Short offline      Completed without error      00%      238        -

 

SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1

SMART Selective self-test log data structure revision number 0

Warning: ATA Specification requires selective self-test log data structure revision number = 1

SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS

    1        0        0  Self_test_in_progress [70% left] (0-65535)

    2        0        0  Not_testing

    3        0        0  Not_testing

    4        0        0  Not_testing

    5        0        0  Not_testing

Selective self-test flags (0x0):

  After scanning selected spans, do NOT read-scan remainder of disk.

If Selective self-test is pending on power-up, resume after 0 minute delay.

 

Drive looks fine. You may have a bad or loose cable to it though. The logged error is likely caused by that. But it is only one - maybe you already saw and fixed it.

Okay thanks for the quick reply. I'm glad that the drive isn't going, a lot of drama surrounding this drive so I was a bit concerned that the drive may be failing. That raw read error isn't a problem? Or the load cycle count?

Nope. Most of the smart attribute RAW values vary by manufacturer and are not meant for human interpretation. I see nothing unusual there. Again, the logged error may indicate a cabling problem.

Thank you...will replace cable and see.