January 25, 201214 yr Hello, My cache disk recently started spitting out these errors in the log file: Jan 25 12:59:10 kenny kernel: hdb: task_pio_intr: status=0x59 { DriveReady SeekComplete DataRequest Error } Jan 25 12:59:10 kenny kernel: hdb: task_pio_intr: error=0x40 { UncorrectableError }, LBAsect=360971415, sector=360971415 Jan 25 12:59:10 kenny kernel: hdb: possibly failed opcode: 0x29 Jan 25 12:59:10 kenny kernel: end_request: I/O error, dev hdb, sector 360971415 Jan 25 12:59:10 kenny kernel: Buffer I/O error on device hdb1, logical block 45121419 Jan 25 12:59:23 kenny kernel: hdb: task_pio_intr: status=0x59 { DriveReady SeekComplete DataRequest Error } Jan 25 12:59:23 kenny kernel: hdb: task_pio_intr: error=0x40 { UncorrectableError }, LBAsect=360971927, sector=360971927 Jan 25 12:59:23 kenny kernel: hdb: possibly failed opcode: 0x29 Jan 25 12:59:23 kenny kernel: end_request: I/O error, dev hdb, sector 360971927 Jan 25 12:59:23 kenny kernel: Buffer I/O error on device hdb1, logical block 45121483 I did a full smart check and the following error was repeating at different LBA's: Error 1258 occurred at disk power-on lifetime: 58815 hours (2450 days + 15 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 16 fc 83 f0 Error: UNC at LBA = 0x0083fc16 = 8649750 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 29 00 08 0f fc 83 15 00 5d+16:02:20.950 READ MULTIPLE EXT 29 00 08 0f fc 83 15 00 5d+16:02:20.950 READ MULTIPLE EXT 29 00 08 07 fc 83 15 00 5d+16:02:20.950 READ MULTIPLE EXT 29 00 08 ff fb 83 15 00 5d+16:02:20.950 READ MULTIPLE EXT 29 00 08 f7 fb 83 15 00 5d+16:02:20.950 READ MULTIPLE EXT Is this a dying hard drive or is there a specific disk check i can do to help fix the problem?
January 27, 201214 yr Author SMART status Info for /dev/hdb smartctl 5.40 2010-10-16 r3189 [i486-slackware-linux-gnu] (local build) Copyright © 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Model Family: Western Digital Caviar SE family Device Model: WDC WD2000JB-00GVA0 Serial Number: WD-WMAL81014852 Firmware Version: 08.02D08 User Capacity: 200,049,647,616 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 6 ATA Standard is: Exact ATA specification draft version not indicated Local Time is: Thu Jan 26 21:44:22 2012 EST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED See vendor-specific Attribute list for marginal Attributes. General SMART Values: Offline data collection status: (0x84) Offline data collection activity was suspended by an interrupting command from host. Auto Offline Data Collection: Enabled. Self-test execution status: ( 73) The previous self-test completed having a test element that failed and the test element that failed is not known. Total time to complete Offline data collection: (5778) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 75) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x001f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 199 001 051 Pre-fail Always In_the_past 10 3 Spin_Up_Time 0x0007 115 081 021 Pre-fail Always - 4783 4 Start_Stop_Count 0x0032 096 096 040 Old_age Always - 4521 5 Reallocated_Sector_Ct 0x0033 190 190 140 Pre-fail Always - 157 7 Seek_Error_Rate 0x000b 200 200 051 Pre-fail Always - 0 9 Power_On_Hours 0x0032 020 020 000 Old_age Always - 58847 10 Spin_Retry_Count 0x0013 100 100 051 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0013 100 100 051 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 328 194 Temperature_Celsius 0x0022 101 085 000 Old_age Always - 49 196 Reallocated_Event_Count 0x0032 171 171 000 Old_age Always - 29 197 Current_Pending_Sector 0x0012 193 193 000 Old_age Always - 234 198 Offline_Uncorrectable 0x0012 200 200 000 Old_age Always - 0 199 UDMA_CRC_Error_Count 0x000a 200 253 000 Old_age Always - 500 200 Multi_Zone_Error_Rate 0x0009 200 200 051 Pre-fail Offline - 0 SMART Error Log Version: 1 ATA Error Count: 1321 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1321 occurred at disk power-on lifetime: 58846 hours (2451 days + 22 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 37 3c f8 f0 Error: UNC 8 sectors at LBA = 0x00f83c37 = 16268343 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 37 3c f8 0e 00 10:33:16.750 READ DMA EXT 25 00 08 2f 3c f8 0e 00 10:33:16.750 READ DMA EXT 25 00 08 27 3c f8 0e 00 10:33:16.750 READ DMA EXT 25 00 08 1f 0d f8 00 00 10:33:16.750 READ DMA EXT 25 00 08 1f 3c f8 0e 00 10:33:16.750 READ DMA EXT Error 1320 occurred at disk power-on lifetime: 58846 hours (2451 days + 22 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 80 37 3c f8 f0 Error: UNC 128 sectors at LBA = 0x00f83c37 = 16268343 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 80 cf 3b f8 0e 00 10:33:09.950 READ DMA EXT 25 00 80 cf 3b f8 0e 00 10:33:09.950 READ DMA EXT 10 00 3f 00 00 00 00 00 10:33:09.950 RECALIBRATE [OBS-4] 25 00 80 cf 3b f8 0e 00 10:33:09.950 READ DMA EXT 25 00 80 cf 3b f8 0e 00 10:33:09.950 READ DMA EXT Error 1319 occurred at disk power-on lifetime: 58846 hours (2451 days + 22 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 01 51 80 37 3c f8 f0 Error: AMNF 128 sectors at LBA = 0x00f83c37 = 16268343 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 80 cf 3b f8 0e 00 10:33:07.950 READ DMA EXT 10 00 3f 00 00 00 00 00 10:33:07.950 RECALIBRATE [OBS-4] 25 00 80 cf 3b f8 0e 00 10:33:07.950 READ DMA EXT 25 00 80 cf 3b f8 0e 00 10:33:07.950 READ DMA EXT 25 00 08 bf 0f f8 00 00 10:33:07.950 READ DMA EXT Error 1318 occurred at disk power-on lifetime: 58846 hours (2451 days + 22 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 01 51 80 37 3c f8 f0 Error: AMNF 128 sectors at LBA = 0x00f83c37 = 16268343 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 80 cf 3b f8 0e 00 10:33:05.900 READ DMA EXT 25 00 80 cf 3b f8 0e 00 10:33:05.900 READ DMA EXT 25 00 08 bf 0f f8 00 00 10:33:05.900 READ DMA EXT 35 00 20 17 b1 c0 09 00 10:33:05.900 WRITE DMA EXT 35 00 08 8f aa c0 09 00 10:33:05.900 WRITE DMA EXT Error 1317 occurred at disk power-on lifetime: 58846 hours (2451 days + 22 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 01 51 80 37 3c f8 f0 Error: AMNF 128 sectors at LBA = 0x00f83c37 = 16268343 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 80 cf 3b f8 0e 00 10:33:03.800 READ DMA EXT 25 00 08 bf 0f f8 00 00 10:33:03.800 READ DMA EXT 35 00 20 17 b1 c0 09 00 10:33:03.800 WRITE DMA EXT 35 00 08 8f aa c0 09 00 10:33:03.800 WRITE DMA EXT 25 00 80 8f 3a f8 0e 00 10:33:03.800 READ DMA EXT SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed: unknown failure 90% 58818 22806528 # 2 Short offline Completed without error 00% 47812 - # 3 Short offline Aborted by host 50% 47812 - # 4 Short offline Completed without error 00% 47812 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
January 27, 201214 yr That drive is starting to fail. Replace it ASAP. You can run a few pre-clears on it to see what happens with the Current_Pending_Sector Reallocated_Sector_Ct values. Post a new SMART report after the pre-clears.
Archived
This topic is now archived and is closed to further replies.