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Slow drive on pre-clear

Featured Replies

I have a HP ProLiant MicroServer N36L with 4 identical drives in the front SATA slot.

Official bios with all the settings checked.

 

Untill now 1 of the drives is very slow during pre-clearing. I'm doing a second pre-clear on it, but it's still on 9Mb/s

The drives are around 3 years old, I tested another drive and those speeds are as they should be.

Here is my log file for the ones that are interested in helping me to analyse this problem :)

 

- Could it be a bad drive?

- Or could it be an AAM setting, does an acoustic mode have any inpact on this process?

 

 

Disk: /dev/sdb
smartctl 5.40 2010-10-16 r3189 [i486-slackware-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family:     SAMSUNG SpinPoint F1 DT series
Device Model:     SAMSUNG HD753LJ
Serial Number:    S13UJ1FQ310890
Firmware Version: 1AA01109
User Capacity:    750,155,292,160 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 3b
Local Time is:    Sun Dec 16 23:35:02 2012 Local time zone must be set--see zic m
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
				was never started.
				Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
				without error or no self-test has ever 
				been run.
Total time to complete Offline 
data collection: 		 (11393) seconds.
Offline data collection
capabilities: 			 (0x7b) SMART execute Offline immediate.
				Auto Offline data collection on/off support.
				Suspend Offline collection upon new
				command.
				Offline surface scan supported.
				Self-test supported.
				Conveyance Self-test supported.
				Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
				power-saving mode.
				Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
				General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 191) minutes.
Conveyance self-test routine
recommended polling time: 	 (  20) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
				SCT Error Recovery Control supported.
				SCT Feature Control supported.
				SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   100   100   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0007   075   075   011    Pre-fail  Always       -       8230
  4 Start_Stop_Count        0x0032   099   099   000    Old_age   Always       -       904
  5 Reallocated_Sector_Ct   0x0033   100   100   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000f   100   100   051    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0025   100   100   015    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0032   093   093   000    Old_age   Always       -       34172
10 Spin_Retry_Count        0x0033   100   100   051    Pre-fail  Always       -       0
11 Calibration_Retry_Count 0x0012   100   100   000    Old_age   Always       -       0
12 Power_Cycle_Count       0x0032   099   099   000    Old_age   Always       -       682
13 Read_Soft_Error_Rate    0x000e   100   100   000    Old_age   Always       -       0
183 Runtime_Bad_Block       0x0032   100   100   000    Old_age   Always       -       0
184 End-to-End_Error        0x0033   100   100   099    Pre-fail  Always       -       0
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       0
188 Command_Timeout         0x0032   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0022   080   044   000    Old_age   Always       -       20 (Min/Max 15/20)
194 Temperature_Celsius     0x0022   074   044   000    Old_age   Always       -       26 (0 58 26 15)
195 Hardware_ECC_Recovered  0x001a   100   100   000    Old_age   Always       -       9010
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   100   100   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x000a   100   100   000    Old_age   Always       -       0
201 Soft_Read_Error_Rate    0x000a   253   253   000    Old_age   Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 0
Warning: ATA Specification requires self-test log structure revision number = 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

 

========================================================================1.13
== invoked as: /boot/preclear_disk.sh -A /dev/sdb
==  SAMSUNG HD753LJ    S13UJ1FQ310890
== Disk /dev/sdb has been successfully precleared
== with a starting sector of 64 
== Ran 1 cycle
==
== Using :Read block size = 8225280 Bytes
== Last Cycle's Pre Read Time  : 3:28:14 (60 MB/s)
== Last Cycle's Zeroing time   : 22:58:50 (9 MB/s)
== Last Cycle's Post Read Time : 7:30:43 (27 MB/s)
== Last Cycle's Total Time     : 33:58:48
==
== Total Elapsed Time 33:58:48
==
== Disk Start Temperature: 20C
==
== Current Disk Temperature: 27C, 
==
============================================================================
** Changed attributes in files: /tmp/smart_start_sdb  /tmp/smart_finish_sdb
                ATTRIBUTE   NEW_VAL OLD_VAL FAILURE_THRESHOLD STATUS      RAW_VALUE
         End-to-End_Error =   100     100           99        near_thresh 0
  Airflow_Temperature_Cel =    73      80            0        ok          27
      Temperature_Celsius =    73      74            0        ok          27
No SMART attributes are FAILING_NOW

0 sectors were pending re-allocation before the start of the preclear.
0 sectors were pending re-allocation after pre-read in cycle 1 of 1.
0 sectors were pending re-allocation after zero of disk in cycle 1 of 1.
0 sectors are pending re-allocation at the end of the preclear,
    the number of sectors pending re-allocation did not change.
0 sectors had been re-allocated before the start of the preclear.
0 sectors are re-allocated at the end of the preclear,
    the number of sectors re-allocated did not change. 
============================================================================

 

Disk: /dev/sdb
smartctl 5.40 2010-10-16 r3189 [i486-slackware-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family:     SAMSUNG SpinPoint F1 DT series
Device Model:     SAMSUNG HD753LJ
Serial Number:    S13UJ1FQ310890
Firmware Version: 1AA01109
User Capacity:    750,155,292,160 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 3b
Local Time is:    Tue Dec 18 09:33:50 2012 Local time zone must be set--see zic m
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
				was never started.
				Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
				without error or no self-test has ever 
				been run.
Total time to complete Offline 
data collection: 		 (11393) seconds.
Offline data collection
capabilities: 			 (0x7b) SMART execute Offline immediate.
				Auto Offline data collection on/off support.
				Suspend Offline collection upon new
				command.
				Offline surface scan supported.
				Self-test supported.
				Conveyance Self-test supported.
				Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
				power-saving mode.
				Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
				General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 191) minutes.
Conveyance self-test routine
recommended polling time: 	 (  20) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
				SCT Error Recovery Control supported.
				SCT Feature Control supported.
				SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   100   100   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0007   075   075   011    Pre-fail  Always       -       8230
  4 Start_Stop_Count        0x0032   099   099   000    Old_age   Always       -       904
  5 Reallocated_Sector_Ct   0x0033   100   100   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000f   100   100   051    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0025   100   100   015    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0032   093   093   000    Old_age   Always       -       34206
10 Spin_Retry_Count        0x0033   100   100   051    Pre-fail  Always       -       0
11 Calibration_Retry_Count 0x0012   100   100   000    Old_age   Always       -       0
12 Power_Cycle_Count       0x0032   099   099   000    Old_age   Always       -       682
13 Read_Soft_Error_Rate    0x000e   100   100   000    Old_age   Always       -       0
183 Runtime_Bad_Block       0x0032   100   100   000    Old_age   Always       -       0
184 End-to-End_Error        0x0033   100   100   099    Pre-fail  Always       -       0
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       0
188 Command_Timeout         0x0032   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0022   073   044   000    Old_age   Always       -       27 (Min/Max 15/28)
194 Temperature_Celsius     0x0022   073   044   000    Old_age   Always       -       27 (0 58 30 15)
195 Hardware_ECC_Recovered  0x001a   100   100   000    Old_age   Always       -       27170949
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   100   100   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x000a   100   100   000    Old_age   Always       -       0
201 Soft_Read_Error_Rate    0x000a   100   100   000    Old_age   Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 0
Warning: ATA Specification requires self-test log structure revision number = 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

Some drives have AAM settings, and they might slow things down, but others just have firmware that is slower, as they are fast enoough to use as USB drives.

 

I have no idea how to change the AAM settings.  Perhaps an argument to the hdparm command.

  • Author

Seems there is another problem with the drive.

HPA is enabled, this is what I get from using WHS for 2 years before  :(

 

I've build a small ghetto server (mobo in a paper box) and will look into the AAM, if it is enabled.

If I remember correctly, then I used openmediavault for that.

 

I think there is something strange with that drive, but it's not clear just what.

 

Be aware that modern hard drives are not perfect; but that is factored into their design. ECC is used to handle a lot of that imperfection. Hence, it is normal for a drive to report ECC_Recovered values that grow >>at a reasonable pace<<.

 

But your drive appears to be "shouting" Lookie-Here to me:

 

Note from your pre-PreClear SMART report:

  9 Power_On_Hours          0x0032   093   093   000    Old_age   Always       -       34172
...
195 Hardware_ECC_Recovered  0x001a   100   100   000    Old_age   Always       -       9010

and compare to the post-PreClear SMART:

  9 Power_On_Hours          0x0032   093   093   000    Old_age   Always       -       34206
...
195 Hardware_ECC_Recovered  0x001a   100   100   000    Old_age   Always       -       27170949

That's 27+ million such recoveries during the, admittedly intensive, 34 hours of PreClear. On it's own, that seems excessive. But, relative to ~9k during the previous 34000 hours, it seems obscene.

 

I'd focus my attentions/suspicions in this direction.

 

Do you have the pre- & post- SMARTs for one of the other (non-lethargic) HD753LJ drives to compare those values?

 

--UhClem

 

  • 2 weeks later...
  • Author

I do here are some reports of the second drive:

 

Disk: /dev/sdc
smartctl 5.40 2010-10-16 r3189 [i486-slackware-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family:     SAMSUNG SpinPoint F1 DT series
Device Model:     SAMSUNG HD753LJ
Serial Number:    S13UJ1FQ310893
Firmware Version: 1AA01109
User Capacity:    750,156,374,016 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 3b
Local Time is:    Fri Dec 28 08:32:40 2012 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
				was never started.
				Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
				without error or no self-test has ever 
				been run.
Total time to complete Offline 
data collection: 		 (11319) seconds.
Offline data collection
capabilities: 			 (0x7b) SMART execute Offline immediate.
				Auto Offline data collection on/off support.
				Suspend Offline collection upon new
				command.
				Offline surface scan supported.
				Self-test supported.
				Conveyance Self-test supported.
				Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
				power-saving mode.
				Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
				General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 189) minutes.
Conveyance self-test routine
recommended polling time: 	 (  20) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
				SCT Error Recovery Control supported.
				SCT Feature Control supported.
				SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   100   100   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0007   077   077   011    Pre-fail  Always       -       7700
  4 Start_Stop_Count        0x0032   099   099   000    Old_age   Always       -       931
  5 Reallocated_Sector_Ct   0x0033   100   100   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000f   100   100   051    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0025   100   100   015    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0032   093   093   000    Old_age   Always       -       34196
10 Spin_Retry_Count        0x0033   100   100   051    Pre-fail  Always       -       0
11 Calibration_Retry_Count 0x0012   100   100   000    Old_age   Always       -       1
12 Power_Cycle_Count       0x0032   099   099   000    Old_age   Always       -       704
13 Read_Soft_Error_Rate    0x000e   100   100   000    Old_age   Always       -       0
183 Runtime_Bad_Block       0x0032   100   100   000    Old_age   Always       -       0
184 End-to-End_Error        0x0033   100   100   099    Pre-fail  Always       -       0
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       0
188 Command_Timeout         0x0032   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0022   078   047   000    Old_age   Always       -       22 (Min/Max 18/26)
194 Temperature_Celsius     0x0022   078   047   000    Old_age   Always       -       22 (Min/Max 18/27)
195 Hardware_ECC_Recovered  0x001a   100   100   000    Old_age   Always       -       142070520
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   100   100   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x000a   100   100   000    Old_age   Always       -       0
201 Soft_Read_Error_Rate    0x000a   100   100   000    Old_age   Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 0
Warning: ATA Specification requires self-test log structure revision number = 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

 

========================================================================1.13
== invoked as: /boot/preclear_disk.sh -A /dev/sdc
==  SAMSUNG HD753LJ    S13UJ1FQ310893
== Disk /dev/sdc has been successfully precleared
== with a starting sector of 64 
== Ran 1 cycle
==
== Using :Read block size = 8225280 Bytes
== Last Cycle's Pre Read Time  : 3:00:20 (69 MB/s)
== Last Cycle's Zeroing time   : 6:10:48 (33 MB/s)
== Last Cycle's Post Read Time : 7:25:58 (28 MB/s)
== Last Cycle's Total Time     : 16:38:07
==
== Total Elapsed Time 16:38:07
==
== Disk Start Temperature: 22C
==
== Current Disk Temperature: 25C, 
==
============================================================================
** Changed attributes in files: /tmp/smart_start_sdc  /tmp/smart_finish_sdc
                ATTRIBUTE   NEW_VAL OLD_VAL FAILURE_THRESHOLD STATUS      RAW_VALUE
         End-to-End_Error =   100     100           99        near_thresh 0
  Airflow_Temperature_Cel =    75      78            0        ok          25
      Temperature_Celsius =    76      78            0        ok          24
No SMART attributes are FAILING_NOW

0 sectors were pending re-allocation before the start of the preclear.
0 sectors were pending re-allocation after pre-read in cycle 1 of 1.
0 sectors were pending re-allocation after zero of disk in cycle 1 of 1.
0 sectors are pending re-allocation at the end of the preclear,
    the number of sectors pending re-allocation did not change.
0 sectors had been re-allocated before the start of the preclear.
0 sectors are re-allocated at the end of the preclear,
    the number of sectors re-allocated did not change. 
============================================================================

 

Disk: /dev/sdc
smartctl 5.40 2010-10-16 r3189 [i486-slackware-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family:     SAMSUNG SpinPoint F1 DT series
Device Model:     SAMSUNG HD753LJ
Serial Number:    S13UJ1FQ310893
Firmware Version: 1AA01109
User Capacity:    750,156,374,016 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 3b
Local Time is:    Sat Dec 29 01:10:48 2012 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
				was never started.
				Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
				without error or no self-test has ever 
				been run.
Total time to complete Offline 
data collection: 		 (11319) seconds.
Offline data collection
capabilities: 			 (0x7b) SMART execute Offline immediate.
				Auto Offline data collection on/off support.
				Suspend Offline collection upon new
				command.
				Offline surface scan supported.
				Self-test supported.
				Conveyance Self-test supported.
				Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
				power-saving mode.
				Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
				General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 189) minutes.
Conveyance self-test routine
recommended polling time: 	 (  20) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
				SCT Error Recovery Control supported.
				SCT Feature Control supported.
				SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   100   100   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0007   077   077   011    Pre-fail  Always       -       7700
  4 Start_Stop_Count        0x0032   099   099   000    Old_age   Always       -       931
  5 Reallocated_Sector_Ct   0x0033   100   100   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000f   100   100   051    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0025   100   100   015    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0032   093   093   000    Old_age   Always       -       34213
10 Spin_Retry_Count        0x0033   100   100   051    Pre-fail  Always       -       0
11 Calibration_Retry_Count 0x0012   100   100   000    Old_age   Always       -       1
12 Power_Cycle_Count       0x0032   099   099   000    Old_age   Always       -       704
13 Read_Soft_Error_Rate    0x000e   100   100   000    Old_age   Always       -       0
183 Runtime_Bad_Block       0x0032   100   100   000    Old_age   Always       -       0
184 End-to-End_Error        0x0033   100   100   099    Pre-fail  Always       -       0
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       0
188 Command_Timeout         0x0032   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0022   075   047   000    Old_age   Always       -       25 (Min/Max 18/26)
194 Temperature_Celsius     0x0022   076   047   000    Old_age   Always       -       24 (Min/Max 18/27)
195 Hardware_ECC_Recovered  0x001a   100   100   000    Old_age   Always       -       188380304
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   100   100   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x000a   100   100   000    Old_age   Always       -       0
201 Soft_Read_Error_Rate    0x000a   100   100   000    Old_age   Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 0
Warning: ATA Specification requires self-test log structure revision number = 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

I do here are some reports of the second drive:

...

OK; looks like the ECC_Recovered is not an indicative factor here. (The 2nd drive had ~46 million during its pre-clear; but 142M previously.) Seems like that first drive led a "sheltered life" (idle?) during its first 34000 hours.

 

 

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