jimwhite Posted September 29, 2008 Share Posted September 29, 2008 One of my new Seagate 1 TB drives shows 8 Smart errors which seem to have occurred at about 90 hours. I have a suspicion it may have been a case of poor cabling to the drive, but cannot be sure. Can someone more knowledgeable take a look at the smart report below and comment? Statistics for /dev/sdk ST31000340AS_9QJ1BJB2 smartctl version 5.36 [i486-slackware-linux-gnu] Copyright (C) 2002-6 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: ST31000340AS Serial Number: 9QJ1BJB2 Firmware Version: SD15 User Capacity: 1,000,204,886,016 bytes Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 8 ATA Standard is: Not recognized. Minor revision code: 0x29 Local Time is: Mon Sep 29 14:03:44 2008 GMT+4 SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 625) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 232) minutes. Conveyance self-test routine recommended polling time: ( 2) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 117 100 006 Pre-fail Always - 135301548 3 Spin_Up_Time 0x0003 091 089 000 Pre-fail Always - 0 4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 72 5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 84 7 Seek_Error_Rate 0x000f 066 060 030 Pre-fail Always - 4688826 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 727 10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 2 12 Power_Cycle_Count 0x0032 100 037 020 Old_age Always - 47 184 Unknown_Attribute 0x0032 100 100 099 Old_age Always - 0 187 Unknown_Attribute 0x0032 092 092 000 Old_age Always - 8 188 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0 189 Unknown_Attribute 0x003a 100 100 000 Old_age Always - 0 190 Unknown_Attribute 0x0022 058 058 045 Old_age Always - 706215978 194 Temperature_Celsius 0x0022 042 042 000 Old_age Always - 42 (Lifetime Min/Max 0/23) 195 Hardware_ECC_Recovered 0x001a 037 030 000 Old_age Always - 135301548 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 8 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 8 occurred at disk power-on lifetime: 95 hours (3 days + 23 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ff ff ff 0f Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 00 ff ff ff 4f 00 10:08:48.335 [RESERVED FOR SERIAL ATA] 60 00 00 ff ff ff 4f 00 10:08:48.335 [RESERVED FOR SERIAL ATA] 60 00 00 ff ff ff 4f 00 10:08:48.333 [RESERVED FOR SERIAL ATA] 27 00 00 00 00 00 e0 00 10:08:48.333 READ NATIVE MAX ADDRESS EXT ec 00 00 00 00 00 a0 00 10:08:48.332 IDENTIFY DEVICE Error 7 occurred at disk power-on lifetime: 95 hours (3 days + 23 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ff ff ff 0f Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 00 ff ff ff 4f 00 10:08:45.370 [RESERVED FOR SERIAL ATA] 60 00 00 ff ff ff 4f 00 10:08:45.370 [RESERVED FOR SERIAL ATA] 60 00 00 ff ff ff 4f 00 10:08:45.368 [RESERVED FOR SERIAL ATA] 27 00 00 00 00 00 e0 00 10:08:45.368 READ NATIVE MAX ADDRESS EXT ec 00 00 00 00 00 a0 00 10:08:45.366 IDENTIFY DEVICE Error 6 occurred at disk power-on lifetime: 95 hours (3 days + 23 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ff ff ff 0f Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 00 ff ff ff 4f 00 10:08:42.397 [RESERVED FOR SERIAL ATA] 60 00 00 ff ff ff 4f 00 10:08:42.396 [RESERVED FOR SERIAL ATA] 60 00 00 ff ff ff 4f 00 10:08:42.395 [RESERVED FOR SERIAL ATA] 27 00 00 00 00 00 e0 00 10:08:42.394 READ NATIVE MAX ADDRESS EXT ec 00 00 00 00 00 a0 00 10:08:42.393 IDENTIFY DEVICE Error 5 occurred at disk power-on lifetime: 95 hours (3 days + 23 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ff ff ff 0f Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 00 ff ff ff 4f 00 10:08:39.448 [RESERVED FOR SERIAL ATA] 60 00 00 ff ff ff 4f 00 10:08:38.382 [RESERVED FOR SERIAL ATA] 60 00 00 ff ff ff 4f 00 10:08:38.382 [RESERVED FOR SERIAL ATA] 60 00 00 ff ff ff 4f 00 10:08:38.380 [RESERVED FOR SERIAL ATA] 27 00 00 00 00 00 e0 00 10:08:38.379 READ NATIVE MAX ADDRESS EXT Error 4 occurred at disk power-on lifetime: 95 hours (3 days + 23 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ff ff ff 0f Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 00 ff ff ff 4f 00 10:08:35.458 [RESERVED FOR SERIAL ATA] 60 00 00 ff ff ff 4f 00 10:08:35.458 [RESERVED FOR SERIAL ATA] 60 00 00 ff ff ff 4f 00 10:08:35.456 [RESERVED FOR SERIAL ATA] 27 00 00 00 00 00 e0 00 10:08:35.456 READ NATIVE MAX ADDRESS EXT ec 00 00 00 00 00 a0 00 10:08:35.455 IDENTIFY DEVICE SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. Quote Link to comment
WeeboTech Posted September 29, 2008 Share Posted September 29, 2008 This concerns me a bit, that at an early age there are 84 reallocated sectors. 5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 84 7 Seek_Error_Rate 0x000f 066 060 030 Pre-fail Always - 4688826 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 727 But this shows that there are no more conditions present or impending 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0 I do not see any short or long tests scheduled. I would suggest you do at least a short, but preferably a long test. Do this when the machine is idle. smarctl -d ata -t short /dev/sd? where ?= drive letter in question or a long test smarctl -d ata -t short /dev/sd? If you start to see Reallocated_Sector_Ct increasing and/or you see numbers holding or growing in Current_Pending_Sector, Offline_Uncorrectable then the drive will begin to show issues. It looks as you say, this was a short term condition, looking to be in communication with the drive. Quote Link to comment
jimwhite Posted September 29, 2008 Author Share Posted September 29, 2008 Since this is a Seagate 1tb and even 4.4b1 uses ver 5.36 of Smartctl, I'm stuck.... it won't run tests on the Seagates. Quote Link to comment
WeeboTech Posted September 29, 2008 Share Posted September 29, 2008 I'll post my smartctl 5.38. If I forget PM me with a reminder. Quote Link to comment
jimwhite Posted September 29, 2008 Author Share Posted September 29, 2008 Thanx Quote Link to comment
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