thaddeussmith Posted August 10, 2016 Share Posted August 10, 2016 I got the following notice regarding a drive, so I'm trying to determine if I can rebuild and reuse or if it warrants an RMA. Event: unRAID Disk 7 error Subject: Alert [TOWER] - Disk 7 in error state (disk dsbl) Description: WDC_WD4000F9YZ-09N20L1_WD-WCC5D6P4E1UK (sdc) Importance: alert smartctl 6.2 2013-07-26 r3841 [x86_64-linux-4.1.18-unRAID] (local build) Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: WDC WD4000F9YZ-09N20L1 Serial Number: WD-WCC5D6P4E1UK LU WWN Device Id: 5 0014ee 26001574e Firmware Version: 01.01A02 User Capacity: 4,000,787,030,016 bytes [4.00 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: 7200 rpm Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ATA8-ACS (minor revision not indicated) SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Aug 10 07:54:31 2016 CDT SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (40560) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 439) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x70bd) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0027 140 140 021 Pre-fail Always - 11983 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 759 5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0 9 Power_On_Hours 0x0032 093 093 000 Old_age Always - 5153 10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 25 16 Unknown_Attribute 0x0022 006 194 000 Old_age Always - 119861347241 183 Runtime_Bad_Block 0x0032 100 100 000 Old_age Always - 0 192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 9 193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 750 194 Temperature_Celsius 0x0022 111 100 000 Old_age Always - 41 196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 1 SMART Error Log Version: 1 ATA Error Count: 2 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 2 occurred at disk power-on lifetime: 5153 hours (214 days + 17 hours) When the command that caused the error occurred, the device was in standby mode. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 04 51 00 00 00 00 40 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- e3 00 00 00 00 00 40 00 8d+19:39:25.372 IDLE b0 da 00 00 4f c2 00 00 8d+19:39:19.595 SMART RETURN STATUS b0 d1 01 01 4f c2 00 00 8d+19:39:19.592 SMART READ ATTRIBUTE THRESHOLDS [OBS-4] b0 d0 01 00 4f c2 00 00 8d+19:39:19.589 SMART READ DATA ec 00 01 00 00 00 00 00 8d+19:39:19.589 IDENTIFY DEVICE Error 1 occurred at disk power-on lifetime: 5146 hours (214 days + 10 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 00 00 00 40 Error: UNC at LBA = 0x00000000 = 0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 40 00 01 00 00 00 40 00 8d+12:24:09.905 READ VERIFY SECTOR(S) ef 10 02 00 00 00 00 00 8d+12:24:09.683 SET FEATURES [Enable SATA feature] ef 02 00 00 00 00 00 00 8d+12:24:09.683 SET FEATURES [Enable write cache] ef aa 00 00 00 00 00 00 8d+12:24:09.683 SET FEATURES [Enable read look-ahead] ef 03 46 00 00 00 00 00 8d+12:24:09.683 SET FEATURES [set transfer mode] SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. Link to comment
thaddeussmith Posted August 10, 2016 Author Share Posted August 10, 2016 Log package attached. Drive in question is WD-WCC5D6P4E1UK tower-diagnostics-20160810-0754.zip Link to comment
JorgeB Posted August 10, 2016 Share Posted August 10, 2016 It looks like a disk write error: 9 Power_On_Hours 0x0032 093 093 000 Old_age Always - 5153 Error 1 occurred at disk power-on lifetime: 5146 hours (214 days + 10 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 00 00 00 40 Error: UNC at LBA = 0x00000000 = 0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 40 00 01 00 00 00 40 00 8d+12:24:09.905 READ VERIFY SECTOR(S) ef 10 02 00 00 00 00 00 8d+12:24:09.683 SET FEATURES [Enable SATA feature] ef 02 00 00 00 00 00 00 8d+12:24:09.683 SET FEATURES [Enable write cache] ef aa 00 00 00 00 00 00 8d+12:24:09.683 SET FEATURES [Enable read look-ahead] ef 03 46 00 00 00 00 00 8d+12:24:09.683 SET FEATURES [set transfer mode] In theory disk is fine now as there are no pending sectors, you can do an extended SMART test or attempt a rebuild to confirm. If it fails the SMART extended test or rebuild you should RMA, if not, it's up to you as refurbished disks are usually a crapshoot. Link to comment
thaddeussmith Posted August 10, 2016 Author Share Posted August 10, 2016 Thanks for the extra set of eyes. Running extended SMART now and will attempt a rebuild if it passes. What's not clear to me from all of the various guides is how to rebuild a drive in this scenario. Is it just stop array > unassign device > start array >stop array > assign device > start array ...and rebuild? Link to comment
JorgeB Posted August 10, 2016 Share Posted August 10, 2016 Is it just stop array > unassign device > start array >stop array > assign device > start array ...and rebuild? That's it. Link to comment
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