Hi,

 

I have a cache drive with a smart status fail. This started a few days ago. I am trying to run a self test but both quick and extended are not working...I click start and it just blinks once and does nothing.

 

I am not sure if my drive is failing or if its something else.

 

Could use some help.

 

The cache drive is NVME and is working fine with no filesystem errors.

 

it is also good to note that the other drives smart self test is working. Just the cache drive selftest button does nothing.

 

 

Edited October 9, 20196 yr by NoLMTs

Might just be failing SMART because it's past the expect flash life, SMART report will show.

THis is the report unsure what to make of it

 

=== START OF INFORMATION SECTION ===
Model Number:                       Samsung SSD 960 EVO 250GB
Serial Number:                      S3ESNX0K305123P
Firmware Version:                   3B7QCXE7
PCI Vendor/Subsystem ID:            0x144d
IEEE OUI Identifier:                0x002538
Total NVM Capacity:                 250,059,350,016 [250 GB]
Unallocated NVM Capacity:           0
Controller ID:                      2
Number of Namespaces:               1
Namespace 1 Size/Capacity:          250,059,350,016 [250 GB]
Namespace 1 Formatted LBA Size:     512
Namespace 1 IEEE EUI-64:            002538 5381b0353d
Local Time is:                      Wed Oct  9 09:19:50 2019 PDT
Firmware Updates (0x16):            3 Slots, no Reset required
Optional Admin Commands (0x0007):   Security Format Frmw_DL
Optional NVM Commands (0x001f):     Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat
Maximum Data Transfer Size:         512 Pages
Warning  Comp. Temp. Threshold:     77 Celsius
Critical Comp. Temp. Threshold:     79 Celsius

Supported Power States
St Op     Max   Active     Idle   RL RT WL WT  Ent_Lat  Ex_Lat
 0 +     6.04W       -        -    0  0  0  0        0       0
 1 +     5.09W       -        -    1  1  1  1        0       0
 2 +     4.08W       -        -    2  2  2  2        0       0
 3 -   0.0400W       -        -    3  3  3  3      210    1500
 4 -   0.0050W       -        -    4  4  4  4     2200    6000

Supported LBA Sizes (NSID 0x1)
Id Fmt  Data  Metadt  Rel_Perf
 0 +     512       0         0

=== START OF SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
- NVM subsystem reliability has been degraded

SMART/Health Information (NVMe Log 0x02)
Critical Warning:                   0x04
Temperature:                        31 Celsius
Available Spare:                    100%
Available Spare Threshold:          10%
Percentage Used:                    101%
Data Units Read:                    41,419,460 [21.2 TB]
Data Units Written:                 70,909,074 [36.3 TB]
Host Read Commands:                 260,886,613
Host Write Commands:                370,638,289
Controller Busy Time:               5,438
Power Cycles:                       14
Power On Hours:                     3,081
Unsafe Shutdowns:                   9
Media and Data Integrity Errors:    0
Error Information Log Entries:      4
Warning  Comp. Temperature Time:    0
Critical Comp. Temperature Time:    0
Temperature Sensor 1:               31 Celsius
Temperature Sensor 2:               41 Celsius

Error Information (NVMe Log 0x01, max 64 entries)
Num   ErrCount  SQId   CmdId  Status  PELoc          LBA  NSID    VS
  0          4     3  0x021e  0x400e      -            0     1     -
  1          3     3  0x021d  0x400e      -            0     1     -
  2          2     3  0x021c  0x400e      -            0     1     -
  3          1     3  0x021b  0x400e      -            0     1     -
 

11 hours ago, NoLMTs said:

Percentage Used:                    101%

My guess was correct.