December 3, 201213 yr Dear Experts, Should I be worried with the SMART report below please? I did have to run a reiserfsck --fix-fixable on this drive as well which is a concern. Do you think Samsung would accept it as an RMA or does it have to fail completely or not pass the SMART test in order to qualify for a replacement? smartctl -a -d ata /dev/sdd smartctl 5.40 2010-10-16 r3189 [i486-slackware-linux-gnu] (local build) Copyright © 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Device Model: SAMSUNG HD204UI Serial Number: S2H7J1BB228759 Firmware Version: 1AQ10001 User Capacity: 2,000,398,934,016 bytes Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 8 ATA Standard is: ATA-8-ACS revision 6 Local Time is: Mon Dec 3 23:38:13 2012 GMT SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 25) The self-test routine was aborted by the host. Total time to complete Offline data collection: (20880) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 255) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 0 2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0 3 Spin_Up_Time 0x0023 071 064 025 Pre-fail Always - 8902 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 388 5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0 8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 811 10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 252 252 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 69 181 Program_Fail_Cnt_Total 0x0022 100 100 000 Old_age Always - 25027 191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always - 179 192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0 194 Temperature_Celsius 0x0002 064 062 000 Old_age Always - 15 (Min/Max 7/40) 195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0 196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0036 097 097 000 Old_age Always - 1654 200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 1 223 Load_Retry_Count 0x0032 252 252 000 Old_age Always - 0 225 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 397 SMART Error Log Version: 1 ATA Error Count: 49 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 49 occurred at disk power-on lifetime: 531 hours (22 days + 3 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 00 00 00 a0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ec 00 00 00 00 00 a0 08 00:01:25.206 IDENTIFY DEVICE 00 00 01 01 00 00 00 08 00:01:25.206 NOP [Abort queued commands] 00 00 01 01 00 00 00 00 00:01:25.206 NOP [Abort queued commands] 00 00 01 01 00 00 00 00 00:01:25.206 NOP [Abort queued commands] ef 10 02 00 00 00 a0 08 00:01:25.201 SET FEATURES [Reserved for Serial ATA] Error 48 occurred at disk power-on lifetime: 531 hours (22 days + 3 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 00 00 00 a0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ec 00 00 00 00 00 a0 08 00:01:25.185 IDENTIFY DEVICE ec 00 00 00 00 00 a0 08 00:01:25.185 IDENTIFY DEVICE ef 03 42 00 00 00 a0 08 00:01:25.185 SET FEATURES [set transfer mode] ef 10 02 00 00 00 a0 08 00:01:25.185 SET FEATURES [Reserved for Serial ATA] 27 00 00 00 00 00 e0 08 00:01:25.185 READ NATIVE MAX ADDRESS EXT Error 47 occurred at disk power-on lifetime: 531 hours (22 days + 3 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 00 4f c2 00 Error: ABRT Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- b0 d0 01 00 4f c2 00 08 00:01:25.182 SMART READ DATA ef 10 02 00 00 00 a0 08 00:01:25.182 SET FEATURES [Reserved for Serial ATA] 27 00 00 00 00 00 e0 08 00:01:25.182 READ NATIVE MAX ADDRESS EXT ec 00 00 00 00 00 a0 08 00:01:25.182 IDENTIFY DEVICE ef 03 42 00 00 00 a0 08 00:01:25.182 SET FEATURES [set transfer mode] Error 46 occurred at disk power-on lifetime: 531 hours (22 days + 3 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 00 00 00 a0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ec 00 00 00 00 00 a0 08 00:01:25.168 IDENTIFY DEVICE ef 03 42 00 00 00 a0 08 00:01:25.168 SET FEATURES [set transfer mode] ef 10 02 00 00 00 a0 08 00:01:25.168 SET FEATURES [Reserved for Serial ATA] 27 00 00 00 00 00 e0 08 00:01:25.168 READ NATIVE MAX ADDRESS EXT ec 00 00 00 00 00 a0 08 00:01:25.168 IDENTIFY DEVICE Error 45 occurred at disk power-on lifetime: 521 hours (21 days + 17 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 20 00 00 00 e0 Error: ICRC, ABRT 32 sectors at LBA = 0x00000000 = 0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 20 00 00 00 e0 08 00:19:51.839 READ DMA ef 10 02 00 00 00 a0 08 00:19:51.839 SET FEATURES [Reserved for Serial ATA] 27 00 00 00 00 00 e0 08 00:19:51.839 READ NATIVE MAX ADDRESS EXT ec 00 00 00 00 00 a0 08 00:19:51.839 IDENTIFY DEVICE ef 03 42 00 00 00 a0 08 00:19:51.839 SET FEATURES [set transfer mode] SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Aborted by host 90% 515 - # 2 Extended offline Aborted by host 80% 512 - # 3 Extended offline Aborted by host 90% 511 - # 4 Short offline Aborted by host 70% 341 - # 5 Short offline Completed without error 00% 338 - # 6 Short offline Completed without error 00% 338 - # 7 Short offline Completed without error 00% 336 - # 8 Short offline Completed without error 00% 335 - # 9 Short offline Completed without error 00% 333 - #10 Short offline Completed without error 00% 332 - #11 Short offline Completed without error 00% 330 - #12 Short offline Completed without error 00% 329 - #13 Extended offline Aborted by host 80% 325 - #14 Short offline Completed without error 00% 260 - #15 Short offline Completed without error 00% 151 - Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Aborted_by_host [90% left] (0-65535) 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
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