April 1, 201313 yr I am new to UnRaid version 4.7 and am experiencing low write speeds. I noticed this error in the syslogs. Can somebody point me in the right direction? Thanks, Mar 25 19:48:28 Tower kernel: ACPI Error: No handler for Region [sACS] (f75a20c8) [PCI_Config] (20090903/evregion-319) (Errors) Mar 25 19:48:28 Tower kernel: ACPI Error: Region PCI_Config(2) has no handler (20090903/exfldio-295) (Errors) Mar 25 19:48:28 Tower kernel: ACPI Error (psparse-0537): Method parse/execution failed [\PRID.P_D0._STA] (Node f7417f30), AE_NOT_EXIST (Minor Issues) Mar 25 19:48:28 Tower kernel: ACPI Error (uteval-0250): Method execution failed [\PRID.P_D0._STA] (Node f7417f30), AE_NOT_EXIST (Minor Issues) Mar 25 19:48:28 Tower kernel: ACPI Error: No handler for Region [sACS] (f75a20c8) [PCI_Config] (20090903/evregion-319) (Errors) Mar 25 19:48:28 Tower kernel: ACPI Error: Region PCI_Config(2) has no handler (20090903/exfldio-295) (Errors) Mar 25 19:48:28 Tower kernel: ACPI Error (psparse-0537): Method parse/execution failed [\PRID.P_D1._STA] (Node f7417fd8), AE_NOT_EXIST (Minor Issues) Mar 25 19:48:28 Tower kernel: ACPI Error (uteval-0250): Method execution failed [\PRID.P_D1._STA] (Node f7417fd8), AE_NOT_EXIST (Minor Issues) Mar 25 19:48:28 Tower kernel: ACPI Error: No handler for Region [sACS] (f75a20c8) [PCI_Config] (20090903/evregion-319) (Errors) Mar 25 19:48:28 Tower kernel: ACPI Error: Region PCI_Config(2) has no handler (20090903/exfldio-295) (Errors) Mar 25 19:48:28 Tower kernel: ACPI Error (psparse-0537): Method parse/execution failed [\SECD.S_D0._STA] (Node f75a3150), AE_NOT_EXIST (Minor Issues) Mar 25 19:48:28 Tower kernel: ACPI Error (uteval-0250): Method execution failed [\SECD.S_D0._STA] (Node f75a3150), AE_NOT_EXIST (Minor Issues) Mar 25 19:48:28 Tower kernel: ACPI Error: No handler for Region [sACS] (f75a20c8) [PCI_Config] (20090903/evregion-319) (Errors) Mar 25 19:48:28 Tower kernel: ACPI Error: Region PCI_Config(2) has no handler (20090903/exfldio-295) (Errors) Mar 25 19:48:28 Tower kernel: ACPI Error (psparse-0537): Method parse/execution failed [\SECD.S_D1._STA] (Node f75a31f8), AE_NOT_EXIST (Minor Issues) Mar 25 19:48:28 Tower kernel: ACPI Error (uteval-0250): Method execution failed [\SECD.S_D1._STA] (Node f75a31f8), AE_NOT_EXIST (Minor Issues) Mar 25 19:48:28 Tower kernel: thermal LNXTHERM:01: registered as thermal_zone0 syslog-2013-04-02.txt
April 2, 201313 yr Author Updated with log and found the smart history... smartctl -a -d ata /dev/sda (disk1) smartctl 5.39.1 2010-01-28 r3054 [i486-slackware-linux-gnu] (local build) Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Device Model: WDC WD20EARX-00PASB0 Serial Number: WD-WMAZA8081226 Firmware Version: 51.0AB51 User Capacity: 2,000,398,934,016 bytes Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 8 ATA Standard is: Exact ATA specification draft version not indicated Local Time is: Tue Apr 2 18:12:50 2013 CDT SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x84) Offline data collection activity was suspended by an interrupting command from host. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (36600) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 255) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x3035) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0027 172 172 021 Pre-fail Always - 6358 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 56 5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 404 10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 17 192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 12 193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 482 194 Temperature_Celsius 0x0022 130 108 000 Old_age Always - 20 196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. smartctl -a -d ata /dev/sdb (disk2) smartctl 5.39.1 2010-01-28 r3054 [i486-slackware-linux-gnu] (local build) Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Device Model: WDC WD20EARX-00PASB0 Serial Number: WD-WMAZA7525129 Firmware Version: 51.0AB51 User Capacity: 2,000,398,934,016 bytes Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 8 ATA Standard is: Exact ATA specification draft version not indicated Local Time is: Tue Apr 2 18:14:18 2013 CDT SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (41700) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 255) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x3035) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0027 170 166 021 Pre-fail Always - 6500 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 58 5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 644 10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 17 192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 12 193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 629 194 Temperature_Celsius 0x0022 132 110 000 Old_age Always - 18 196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
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