December 22, 201312 yr So this will be my 7th drive I've precleared on my server. First 6 no issues. This one gives me the following error. ========================================================================1.14 == invoked as: ./preclear_disk.sh -A -c 3 -m .......... /dev/sde == == Disk /dev/sde has NOT been successfully precleared == Postread detected un-expected non-zero bytes on disk== == Ran 3 cycles == == Using :Read block size = 8388608 Bytes == Last Cycle's Pre Read Time : 6:20:59 (87 MB/s) == Last Cycle's Zeroing time : 5:37:28 (98 MB/s) == Last Cycle's Post Read Time : 13:18:11 (41 MB/s) == Last Cycle's Total Time : 18:56:43 == == Total Elapsed Time 63:08:37 == == Disk Start Temperature: 20C == == Current Disk Temperature: 25C, == ============================================================================ ** Changed attributes in files: /tmp/smart_start_sde /tmp/smart_finish_sde ATTRIBUTE NEW_VAL OLD_VAL FAILURE_THRESHOLD STATUS RAW_VALUE G-Sense_Error_Rate = 100 252 0 ok 6 No SMART attributes are FAILING_NOW 0 sectors were pending re-allocation before the start of the preclear. 0 sectors were pending re-allocation after pre-read in cycle 1 of 3. 0 sectors were pending re-allocation after zero of disk in cycle 1 of 3. 0 sectors were pending re-allocation after post-read in cycle 1 of 3. 0 sectors were pending re-allocation after zero of disk in cycle 2 of 3. 0 sectors were pending re-allocation after post-read in cycle 2 of 3. 0 sectors were pending re-allocation after zero of disk in cycle 3 of 3. 0 sectors are pending re-allocation at the end of the preclear, the number of sectors pending re-allocation did not change. 0 sectors had been re-allocated before the start of the preclear. 0 sectors are re-allocated at the end of the preclear, the number of sectors re-allocated did not change. ============================================================================ ============================================================================ == == S.M.A.R.T Initial Report for /dev/sde == Disk: /dev/sde smartctl 5.40 2010-10-16 r3189 [i486-slackware-linux-gnu] (local build) Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Device Model: SAMSUNG HD204UI Serial Number: S2H7J1AZA08351 Firmware Version: 1AQ10001 User Capacity: 2,000,398,934,016 bytes Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 8 ATA Standard is: ATA-8-ACS revision 6 Local Time is: Thu Dec 19 18:41:41 2013 EST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (21480) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 255) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 2 2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0 3 Spin_Up_Time 0x0023 067 065 025 Pre-fail Always - 10273 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 707 5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0 8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 555 10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 252 252 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 362 181 Program_Fail_Cnt_Total 0x0022 100 100 000 Old_age Always - 11728 191 G-Sense_Error_Rate 0x0022 252 252 000 Old_age Always - 0 192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0 194 Temperature_Celsius 0x0002 064 064 000 Old_age Always - 20 (Min/Max 13/32) 195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0 196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0036 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 11 223 Load_Retry_Count 0x0032 252 252 000 Old_age Always - 0 225 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 717 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Completed [00% left] (0-65535) 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. == ============================================================================ ============================================================================ == == S.M.A.R.T Final Report for /dev/sde == Disk: /dev/sde smartctl 5.40 2010-10-16 r3189 [i486-slackware-linux-gnu] (local build) Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Device Model: SAMSUNG HD204UI Serial Number: S2H7J1AZA08351 Firmware Version: 1AQ10001 User Capacity: 2,000,398,934,016 bytes Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 8 ATA Standard is: ATA-8-ACS revision 6 Local Time is: Sun Dec 22 09:50:18 2013 EST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (21480) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 255) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 2 2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0 3 Spin_Up_Time 0x0023 067 065 025 Pre-fail Always - 10273 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 707 5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0 8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 618 10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 252 252 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 362 181 Program_Fail_Cnt_Total 0x0022 100 100 000 Old_age Always - 11728 191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always - 6 192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0 194 Temperature_Celsius 0x0002 064 064 000 Old_age Always - 25 (Min/Max 13/32) 195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0 196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0036 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 12 223 Load_Retry_Count 0x0032 252 252 000 Old_age Always - 0 225 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 717 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Completed [00% left] (0-65535) 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. == ============================================================================ I did some searching and found people recommending do a memtest, but I've recently precleared all those other drives no issue? I've seen it recommended to run a advanced SMART test, not sure how to do that though? Any other suggestions or should I toss this drive? Also off-topic, but is there a good way to run preclear from another computer? If not, in the future all my sata slots will be full on my server, so there won't be any adverse affect to unplugging a data drive to preclear a spare?
December 25, 201312 yr See here: http://lime-technology.com/wiki/index.php/Troubleshooting#Obtaining_a_SMART_report
December 25, 201312 yr I had a drive fail last summer, the first clue was an increase in the multi zone error rate, look for MZER articles. Stephen
Archived
This topic is now archived and is closed to further replies.