January 6, 201412 yr one of my disk is getting errors. here is the result of the smart test result. is the disk dying? smartctl -a -d ata /dev/sdj smartctl 5.40 2010-10-16 r3189 [i486-slackware-linux-gnu] (local build) Copyright © 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Model Family: Western Digital Caviar Green family Device Model: WDC WD20EADS-65R6B0 Serial Number: WD-WCAVY2137024 Firmware Version: 01.00A01 User Capacity: 2,000,398,934,016 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 8 ATA Standard is: Exact ATA specification draft version not indicated Local Time is: Mon Jan 6 12:02:46 2014 CST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x84) Offline data collection activity was suspended by an interrupting command from host. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (41580) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 255) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x303f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0027 170 146 021 Pre-fail Always - 8475 4 Start_Stop_Count 0x0032 097 097 000 Old_age Always - 3445 5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0 9 Power_On_Hours 0x0032 058 058 000 Old_age Always - 30827 10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 110 192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 58 193 Load_Cycle_Count 0x0032 152 152 000 Old_age Always - 144432 194 Temperature_Celsius 0x0022 112 098 000 Old_age Always - 40 196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 7 198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 3 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0 SMART Error Log Version: 1 Warning: ATA error count 4 inconsistent with error log pointer 3 ATA Error Count: 4 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 4 occurred at disk power-on lifetime: 30129 hours (1255 days + 9 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 09 88 69 e0 Error: UNC 8 sectors at LBA = 0x00698809 = 6916105 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 07 88 69 e0 08 10d+08:32:32.406 READ DMA c8 00 08 d7 4a 69 e0 08 10d+08:32:32.401 READ DMA c8 00 08 37 3e 69 e0 08 10d+08:32:32.394 READ DMA c8 00 08 bf 00 00 e0 08 10d+08:32:32.372 READ DMA Error 3 occurred at disk power-on lifetime: 29040 hours (1210 days + 0 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 0a 88 69 e0 Error: UNC 8 sectors at LBA = 0x0069880a = 6916106 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 07 88 69 e0 08 14d+16:43:05.462 READ DMA c8 00 08 bf 00 00 e0 08 14d+16:43:05.462 READ DMA ca 00 08 df 5d 00 e0 08 14d+16:43:03.651 WRITE DMA c8 00 08 df 5d 00 e0 08 14d+16:43:03.617 READ DMA Error 2 occurred at disk power-on lifetime: 28118 hours (1171 days + 14 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 d8 4a 69 e0 Error: UNC 8 sectors at LBA = 0x00694ad8 = 6900440 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 d1 08 d7 4a 69 e0 08 00:18:47.906 READ DMA c8 d1 08 37 3e 69 e0 08 00:18:47.899 READ DMA c8 d1 08 bf 00 00 e0 08 00:18:47.884 READ DMA SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
January 6, 201412 yr Yes, the disk is starting to develop bad sectors. The SMART report lists 7 current pending sectors and 3 offline uncorrectable sectors. Assuming it is the only drive in the array with errors, you should replace the drive and rebuild it from parity.
January 6, 201412 yr obviously, try to get it rma'ed if you can. wd has always been very easy for me when returning a failed drive.
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