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Failing Drive?


bnevets27

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Just looked at a SMART report for one of my drives and see some errors. Could someone take a look and see if its something I should be concerned about. Thanks

 

 
smartctl -a -d ata /dev/sde
smartctl version 5.38 [i486-slackware-linux-gnu] Copyright (C) 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Device Model:     Hitachi HDT721010SLA360
Serial Number:    STF607M
Firmware Version: ST6OA3AA
User Capacity:    1,000,204,886,016 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 4
Local Time is:    Tue Sep 14 11:55:17 2010 GMT+4
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x80)	Offline data collection activity
				was never started.
				Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0)	The previous self-test routine completed
				without error or no self-test has ever 
				been run.
Total time to complete Offline 
data collection: 		 (14090) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
				Auto Offline data collection on/off support.
				Suspend Offline collection upon new
				command.
				Offline surface scan supported.
				Self-test supported.
				No Conveyance Self-test supported.
				Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
				power-saving mode.
				Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
				General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   1) minutes.
Extended self-test routine
recommended polling time: 	 ( 235) minutes.
SCT capabilities: 	       (0x003d)	SCT Status supported.
				SCT Feature Control supported.
				SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   100   100   016    Pre-fail  Always       -       0
  2 Throughput_Performance  0x0005   133   133   054    Pre-fail  Offline      -       110
  3 Spin_Up_Time            0x0007   202   202   024    Pre-fail  Always       -       243 (Average 325)
  4 Start_Stop_Count        0x0012   100   100   000    Old_age   Always       -       881
  5 Reallocated_Sector_Ct   0x0033   100   100   005    Pre-fail  Always       -       21
  7 Seek_Error_Rate         0x000b   100   100   067    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0005   125   125   020    Pre-fail  Offline      -       33
  9 Power_On_Hours          0x0012   100   100   000    Old_age   Always       -       3072
10 Spin_Retry_Count        0x0013   100   100   060    Pre-fail  Always       -       0
12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       149
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       988
193 Load_Cycle_Count        0x0012   100   100   000    Old_age   Always       -       988
194 Temperature_Celsius     0x0002   200   200   000    Old_age   Always       -       30 (Lifetime Min/Max 20/52)
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       21
197 Current_Pending_Sector  0x0022   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0008   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x000a   200   200   000    Old_age   Always       -       0

SMART Error Log Version: 1
ATA Error Count: 4
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 4 occurred at disk power-on lifetime: 2063 hours (85 days + 23 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 6c fb cf d3 e5  Error: UNC 108 sectors at LBA = 0x05d3cffb = 97767419

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 00 67 cd d3 e0 08   3d+16:34:16.100  READ DMA EXT
  ef 10 02 00 00 00 a0 08   3d+16:34:16.000  SET FEATURES [Reserved for Serial ATA]
  27 00 00 00 00 00 e0 08   3d+16:34:16.000  READ NATIVE MAX ADDRESS EXT
  ec 00 00 00 00 00 a0 08   3d+16:34:16.000  IDENTIFY DEVICE
  ef 03 46 00 00 00 a0 08   3d+16:34:16.000  SET FEATURES [set transfer mode]

Error 3 occurred at disk power-on lifetime: 2063 hours (85 days + 23 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 6c fb cf d3 e5  Error: UNC 108 sectors at LBA = 0x05d3cffb = 97767419

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 00 67 cd d3 e0 08   3d+16:34:11.600  READ DMA EXT
  ef 10 02 00 00 00 a0 08   3d+16:34:11.600  SET FEATURES [Reserved for Serial ATA]
  27 00 00 00 00 00 e0 08   3d+16:34:11.600  READ NATIVE MAX ADDRESS EXT
  ec 00 00 00 00 00 a0 08   3d+16:34:11.600  IDENTIFY DEVICE
  ef 03 46 00 00 00 a0 08   3d+16:34:11.600  SET FEATURES [set transfer mode]

Error 2 occurred at disk power-on lifetime: 2063 hours (85 days + 23 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 6c fb cf d3 e5  Error: UNC 108 sectors at LBA = 0x05d3cffb = 97767419

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 00 67 cd d3 e0 08   3d+16:34:07.100  READ DMA EXT
  ef 10 02 00 00 00 a0 08   3d+16:34:07.100  SET FEATURES [Reserved for Serial ATA]
  27 00 00 00 00 00 e0 08   3d+16:34:07.100  READ NATIVE MAX ADDRESS EXT
  ec 00 00 00 00 00 a0 08   3d+16:34:07.100  IDENTIFY DEVICE
  ef 03 46 00 00 00 a0 08   3d+16:34:07.100  SET FEATURES [set transfer mode]

Error 1 occurred at disk power-on lifetime: 2063 hours (85 days + 23 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 6c fb cf d3 e5  Error: UNC 108 sectors at LBA = 0x05d3cffb = 97767419

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 00 67 cd d3 e0 08   3d+16:34:02.700  READ DMA EXT
  25 00 00 67 c9 d3 e0 08   3d+16:34:02.700  READ DMA EXT
  25 00 00 67 c5 d3 e0 08   3d+16:34:02.700  READ DMA EXT
  25 00 00 67 c1 d3 e0 08   3d+16:34:02.700  READ DMA EXT
  25 00 00 67 bd d3 e0 08   3d+16:34:02.600  READ DMA EXT

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

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The disk has 21 re-allocated sectors.  Most modern disks have a reserve pool of several thousand.

 

You should monitor that disk over then next few months/years.  If the number starts to increase at a rapid rate, then you might have reason for concern. If not, then do not worry about it.  (If the number increases very slowly over years of use, then it is quite normal)

 

Notice that the "normalized" value of 100 has not budged from it starting initialized value of 100.  (apparently, that drive starts a lot of its "normalized" values at 100 and they go down from there.)  The failure threshold for that parameter is 5.

 

 

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