November 15, 201411 yr https://www.dropbox.com/s/gvpigb60cnrzfev/Screenshot%202014-11-15%2008.55.02.png Any tests i should run to see whats wrong, or is it just time to replace the drive?
November 16, 201411 yr Author === START OF INFORMATION SECTION === Model Family: Western Digital Caviar Green (AF) Device Model: WDC WD20EARS-00MVWB0 Serial Number: WD-WMAZA3056033 LU WWN Device Id: 5 0014ee 2affea483 Firmware Version: 51.0AB51 User Capacity: 2,000,398,934,016 bytes [2.00 TB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS (minor revision not indicated) SATA Version is: SATA 2.6, 3.0 Gb/s Local Time is: Sun Nov 16 17:01:12 2014 EST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x84) Offline data collection activity was suspended by an interrupting command from host. Auto Offline Data Collection: Enabled. Self-test execution status: ( 113) The previous self-test completed having the read element of the test failed. Total time to complete Offline data collection: (36600) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 353) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x3035) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 197 197 051 Pre-fail Always - 18868 3 Spin_Up_Time 0x0027 253 169 021 Pre-fail Always - 1033 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 462 5 Reallocated_Sector_Ct 0x0033 193 193 140 Pre-fail Always - 138 7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0 9 Power_On_Hours 0x0032 055 055 000 Old_age Always - 33118 10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 211 192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 360 193 Load_Cycle_Count 0x0032 001 001 000 Old_age Always - 1235035 194 Temperature_Celsius 0x0022 120 110 000 Old_age Always - 30 196 Reallocated_Event_Count 0x0032 095 095 000 Old_age Always - 105 197 Current_Pending_Sector 0x0032 199 198 000 Old_age Always - 646 198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 48 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 2 200 Multi_Zone_Error_Rate 0x0008 187 159 000 Old_age Offline - 3664 SMART Error Log Version: 1 ATA Error Count: 2 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 2 occurred at disk power-on lifetime: 32742 hours (1364 days + 6 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 70 60 c4 43 ee Error: UNC 112 sectors at LBA = 0x0e43c460 = 239322208 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 70 40 c4 43 ee 08 00:33:04.084 READ DMA c8 00 a8 98 c3 43 ee 08 00:33:04.083 READ DMA c8 00 48 50 c3 43 ee 08 00:33:04.083 READ DMA c8 00 60 f0 c2 43 ee 08 00:33:04.082 READ DMA c8 00 38 b8 c2 43 ee 08 00:33:04.082 READ DMA Error 1 occurred at disk power-on lifetime: 32742 hours (1364 days + 6 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 68 c8 97 e8 ea Error: UNC 104 sectors at LBA = 0x0ae897c8 = 183015368 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 68 b8 97 e8 ea 08 00:27:20.309 READ DMA c8 00 40 f8 95 e8 ea 08 00:27:16.247 READ DMA c8 00 a8 50 95 e8 ea 08 00:27:16.246 READ DMA c8 00 30 20 95 e8 ea 08 00:27:16.246 READ DMA SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed: read failure 10% 33118 314752308 # 2 Extended offline Completed without error 00% 19422 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. syslog.zip
November 16, 201411 yr The SMART report looks a bit doubtful as it shows lots of Pending sectors indicating reads where the data is unreliable. Those sometimes go away the next time the disk is written but are not a good sign. The syslig is also showing lots of read errors on the parity disk. Although there may be external factors at work I would certainly be looking to replace that parity disk.
November 16, 201411 yr This disk would be useful as a door stopper or to stop a car from rolling downhill, but that's about all. Reallocated sectors, pending sectors, multizone errors, and looks like you had a loose cable error a couple weeks ago. But the other issues have nothing to do with cabling - the drive is dying. === START OF INFORMATION SECTION === Model Family: Western Digital Caviar Green (AF) Device Model: WDC WD20EARS-00MVWB0 Serial Number: WD-WMAZA3056033 LU WWN Device Id: 5 0014ee 2affea483 Firmware Version: 51.0AB51 User Capacity: 2,000,398,934,016 bytes [2.00 TB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS (minor revision not indicated) SATA Version is: SATA 2.6, 3.0 Gb/s Local Time is: Sun Nov 16 17:01:12 2014 EST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x84) Offline data collection activity was suspended by an interrupting command from host. Auto Offline Data Collection: Enabled. Self-test execution status: ( 113) The previous self-test completed having the read element of the test failed. Total time to complete Offline data collection: (36600) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 353) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x3035) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 197 197 051 Pre-fail Always - 18868 3 Spin_Up_Time 0x0027 253 169 021 Pre-fail Always - 1033 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 462 5 Reallocated_Sector_Ct 0x0033 193 193 140 Pre-fail Always - 138 7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0 9 Power_On_Hours 0x0032 055 055 000 Old_age Always - 33118 10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 211 192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 360 193 Load_Cycle_Count 0x0032 001 001 000 Old_age Always - 1235035 194 Temperature_Celsius 0x0022 120 110 000 Old_age Always - 30 196 Reallocated_Event_Count 0x0032 095 095 000 Old_age Always - 105 197 Current_Pending_Sector 0x0032 199 198 000 Old_age Always - 646 198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 48 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 2 200 Multi_Zone_Error_Rate 0x0008 187 159 000 Old_age Offline - 3664 SMART Error Log Version: 1 ATA Error Count: 2 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 2 occurred at disk power-on lifetime: 32742 hours (1364 days + 6 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 70 60 c4 43 ee Error: UNC 112 sectors at LBA = 0x0e43c460 = 239322208 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 70 40 c4 43 ee 08 00:33:04.084 READ DMA c8 00 a8 98 c3 43 ee 08 00:33:04.083 READ DMA c8 00 48 50 c3 43 ee 08 00:33:04.083 READ DMA c8 00 60 f0 c2 43 ee 08 00:33:04.082 READ DMA c8 00 38 b8 c2 43 ee 08 00:33:04.082 READ DMA Error 1 occurred at disk power-on lifetime: 32742 hours (1364 days + 6 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 68 c8 97 e8 ea Error: UNC 104 sectors at LBA = 0x0ae897c8 = 183015368 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 68 b8 97 e8 ea 08 00:27:20.309 READ DMA c8 00 40 f8 95 e8 ea 08 00:27:16.247 READ DMA c8 00 a8 50 95 e8 ea 08 00:27:16.246 READ DMA c8 00 30 20 95 e8 ea 08 00:27:16.246 READ DMA SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed: read failure 10% 33118 314752308 # 2 Extended offline Completed without error 00% 19422 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
November 16, 201411 yr thank you all time to get a 3 or 4 tb drive As a piece of information that you may NOT be aware of, you are now essentially running without parity protection. If one of your data drives goes 'south', you will lose data! I would be replacing that drive as soon as possible. (I had a similar situation about six weeks ago. I shut that server down, ordered a replacement parity drive, ran two preclear cycles on it (on my test bed server), installed the drive and rebuilt parity. I then ran a non-correcting parity check to assure that I was fully protected again.)
November 17, 201411 yr You have to wonder how it came to this conclusion "SMART overall-health self-assessment test result: PASSED" That drive doesn't look healthy at all.
November 17, 201411 yr You have to wonder how it came to this conclusion "SMART overall-health self-assessment test result: PASSED" That drive doesn't look healthy at all. It can be rationalized that the drive will work just fine for many applications. Most uses of hard drives do not require that all the sectors on a drive be readable-- just the ones that have "data" stored in them in an recognized operating system file. unRAID requires that every sector on the drive that is in the 'good sector' table be readable for what most of us consider to be a extremely important operation-- rebuilding another drive!
November 17, 201411 yr You have to wonder how it came to this conclusion "SMART overall-health self-assessment test result: PASSED" That drive doesn't look healthy at all. 5 Reallocated_Sector_Ct 0x0033 193 193 140 Pre-fail Always - 138 196 Reallocated_Event_Count 0x0032 095 095 000 Old_age Always - 105 197 Current_Pending_Sector 0x0032 199 198 000 Old_age Always - 646 198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 48 ... # 1 Short offline Completed: read failure 10% 33118 314752308 This is why I suggested to Bonnel (dynamix) that using the self-assessment value as PASSED isn't good enough for unRAID. Given the current method of providing thumbs up isn't the whole story.
November 17, 201411 yr You have to wonder how it came to this conclusion "SMART overall-health self-assessment test result: PASSED" That drive doesn't look healthy at all. Hard drive manufacturers don't want people RMAing drives due to a handful of SMART errors. This costs them money. Manufacturers would probably rather that SMART didn't exist.
November 18, 201411 yr You have to wonder how it came to this conclusion "SMART overall-health self-assessment test result: PASSED" That drive doesn't look healthy at all. Hard drive manufacturers don't want people RMAing drives due to a handful of SMART errors. This costs them money. Manufacturers would probably rather that SMART didn't exist. I'm sure they wouldn't but the "program" that checks the SMART status and prints out all that data isn't doing anyone any favours telling you the drive has "passed". Some people will only read that far! The manufacturers didn't make that program did they? SMART isn't even that accurate due to the fact that each manufacturer has different parameters, and then SSD drives changed it all again. I haven't found a SMART test program that actually does a good job across a range of drives. Manually accessing the data is always best. If any drive, in my PC or NAS has a decent amount of errors in SMART (after manually looking over the data), I remove it from use and replace it, and test it a lot before I even think of reusing it. OCD maybe but under these uses I don't want to take the chance and have to clean up later if it all goes wrong. For stuff you don't care about like HDD TV Tuner devices that just record TV you wouldn't really care, but there aren't that many situations where a failing hard drive is a good think to keep using. Hard drives are also pretty cheap these days. $120AU gets 2Tb here which for most isn't going to be a massive issue. I've had 2 hard drives fail on my PC last month. One was partially recoverable, and has loads of issues with slow read speeds but passed a SMART test, and only had 50 bad sectors. The other was passing tests fine, but the PC didn't like it being connected on boot, and even in a USB enclosure it was throwing up errors all over the place.
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