Is End-to-End_Error something that I need to be worried about ?
== Hitachi HTS541010A9E680 J8100019J1XWJA
** Changed attributes in files: /tmp/smart_start_sdb /tmp/smart_finish_sdb
ATTRIBUTE NEW_VAL OLD_VAL FAILURE_THRESHOLD STATUS RAW_VALUE
End-to-End_Error = 100 100 97 near_thresh 0
Airflow_Temperature_Cel = 74 76 45 In_the_past 26
No SMART attributes are FAILING_NOW
0 sectors were pending re-allocation before the start of the preclear.
0 sectors were pending re-allocation after pre-read in cycle 1 of 1.
0 sectors were pending re-allocation after zero of disk in cycle 1 of 1.
0 sectors are pending re-allocation at the end of the preclear,
the number of sectors pending re-allocation did not change.
0 sectors had been re-allocated before the start of the preclear.
0 sectors are re-allocated at the end of the preclear,
the number of sectors re-allocated did not change.
SMART status Info for /dev/sdb
smartctl 5.40 2010-10-16 r3189 [i486-slackware-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: Hitachi HTS541010A9E680
Serial Number: J8100019J1XWJA
Firmware Version: JA0OA4D0
User Capacity: 1,000,204,886,016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 6
Local Time is: Sun Sep 8 07:55:16 2013 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 247) Self-test routine in progress...
70% of test remaining.
Total time to complete Offline
data collection: ( 45) seconds.
Offline data collection
capabilities: (0x51) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 241) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 100 100 062 Pre-fail Always - 0
2 Throughput_Performance 0x0025 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0023 170 100 033 Pre-fail Always - 1
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 1565
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x002f 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0025 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 097 097 000 Old_age Always - 1721
10 Spin_Retry_Count 0x0033 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1479
183 Runtime_Bad_Block 0x0032 100 100 000 Old_age Always - 0
184 End-to-End_Error 0x0033 100 100 097 Pre-fail Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 25769803777
188 Command_Timeout 0x0032 100 100 000 Old_age Always - 73015623682
190 Airflow_Temperature_Cel 0x0022 079 044 045 Old_age Always In_the_past 21 (Min/Max 21/30)
191 G-Sense_Error_Rate 0x0032 096 096 000 Old_age Always - 1198
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 1966110
193 Load_Cycle_Count 0x0032 098 098 000 Old_age Always - 23668
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0036 100 100 000 Old_age Always - 0
223 Load_Retry_Count 0x002a 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 494 hours (20 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 41 00 00 75 64 07
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 98 f0 62 ed 40 00 00:42:01.616 READ FPDMA QUEUED
60 00 90 f0 61 ed 40 00 00:42:01.615 READ FPDMA QUEUED
60 00 88 f0 60 ed 40 00 00:42:01.614 READ FPDMA QUEUED
60 00 80 f0 5f ed 40 00 00:42:01.613 READ FPDMA QUEUED
60 00 78 f0 5e ed 40 00 00:42:01.610 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.