February 18, 201115 yr Correct. After waiting for it to complete. Joe L. Test should be completed now. But `smartctl -a /dev/sda` yields the same output, except for the timestamp and Raw_Read_Error_Rate, Power_On_Hours and Hardware_ECC_Recovered fields. I guess that's it then? Nothing else to try?
February 18, 201115 yr Correct. After waiting for it to complete. Joe L. Test should be completed now. But `smartctl -a /dev/sda` yields the same output, except for the timestamp and Raw_Read_Error_Rate, Power_On_Hours and Hardware_ECC_Recovered fields. I guess that's it then? Nothing else to try? The difference would only be one line towards the bottom of the report. Again, you're on your own... an SSD is a very different beast than a spinning disk and I doubt it implements SMART in the same way.
February 18, 201115 yr I know the OCZ SandForce-based drives have their own meaning to the SMART attributes. My OCZ Indilinx Vertex 1 drive barely implements SMART and the values it returns have no meaning to consumers. EDIT: Here's the SandForce SMART information: http://www.ocztechnologyforum.com/forum/showthread.php?75786-SMART-Attributes-for-Sandforce-SSD-s-%28Agility2-Vertex2-VertexLE%29
February 18, 201115 yr The latest HWiNFO32 (v3.70) claims "Added new SSD SMART attributes". You would need to access it on a Windows machine though.
February 18, 201115 yr Just finished Preclearing this drive with the updated preclear.sh can you guys let me know how it looks good or bad thanks. ========================================================================1.3 == invoked as: ./preclear_disk.sh -M 4 /dev/sdd == == Disk /dev/sdd has been successfully precleared == with a starting sector of 63 == Ran 1 cycle == == Using :Read block size = 8225280 Bytes == Last Cycle's Pre Read Time : 7:18:51 (75 MB/s) == Last Cycle's Zeroing time : 6:16:52 (88 MB/s) == Last Cycle's Post Read Time : 12:53:20 (43 MB/s) == Last Cycle's Total Time : 26:30:13 == == Total Elapsed Time 26:30:13 == == Disk Start Temperature: 25C == == Current Disk Temperature: 25C, == ============================================================================ No SMART attributes are FAILING_NOW 0 sectors were pending re-allocation before the start of the preclear. 0 sectors are pending re-allocation at the end of the preclear, the number of sectors pending re-allocation did not change. 0 sectors had been re-allocated before the start of the preclear. 0 sectors are re-allocated at the end of the preclear, the number of sectors re-allocated did not change. ============================================================================ ============================================================================ == == S.M.A.R.T Initial Report for /dev/sdd == Disk: /dev/sdd smartctl 5.39.1 2010-01-28 r3054 [i486-slackware-linux-gnu] (local build) Copyright © 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Device Model: WDC WD20EARS-00MVWB0 Serial Number: WD-WMAZA3209988 Firmware Version: 51.0AB51 User Capacity: 2,000,398,934,016 bytes Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 8 ATA Standard is: Exact ATA specification draft version not indicated Local Time is: Wed Feb 16 21:32:15 2011 Local time zone must be set--see zic m SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x80) Offline data collection activity was never started. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (36780) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 255) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x3035) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 100 253 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0027 253 253 021 Pre-fail Always - 941 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 6 5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 100 253 000 Old_age Always - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 6 10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 5 192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 2 193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 42 194 Temperature_Celsius 0x0022 125 118 000 Old_age Always - 25 196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. == ============================================================================ ============================================================================ == == S.M.A.R.T Final Report for /dev/sdd == Disk: /dev/sdd smartctl 5.39.1 2010-01-28 r3054 [i486-slackware-linux-gnu] (local build) Copyright © 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Device Model: WDC WD20EARS-00MVWB0 Serial Number: WD-WMAZA3209988 Firmware Version: 51.0AB51 User Capacity: 2,000,398,934,016 bytes Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 8 ATA Standard is: Exact ATA specification draft version not indicated Local Time is: Fri Feb 18 00:02:27 2011 Local time zone must be set--see zic m SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x84) Offline data collection activity was suspended by an interrupting command from host. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (36780) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 255) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x3035) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0027 253 253 021 Pre-fail Always - 941 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 6 5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 32 10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 5 192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 2 193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 43 194 Temperature_Celsius 0x0022 125 118 000 Old_age Always - 25 196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. == ============================================================================
February 18, 201115 yr First, that is not the most recent preclear_disk.sh. It is currently at version 1.6. The disk looks fine. There are no re-allocated sectors, nor any pending re-allocation. No other attributes are failing now. Enjoy your new disk, and always grab a new version of preclear_disk.sh before you clear a new disk. The final report on newer versions is much improved. Joe L.
February 18, 201115 yr Hi Guys, I precleared my first Hitachi 5K3000 drive (3 cycles) and got the following results: ** Changed attributes in files: /tmp/smart_start_sdi /tmp/smart_finish_sdi ATTRIBUTE NEW_VAL OLD_VAL FAILURE_THRESHOLD STATUS RAW_VALUE Temperature_Celsius = 206 253 0 ok 29 No SMART attributes are FAILING_NOW 0 sectors were pending re-allocation before the start of the preclear. 0 sectors are pending re-allocation at the end of the preclear, the number of sectors pending re-allocation did not change. 0 sectors had been re-allocated before the start of the preclear. 0 sectors are re-allocated at the end of the preclear, the number of sectors re-allocated did not change. ============================================================================ ============================================================================ The temp never went above 30 degrees C, that I saw. I don't remember seeing that change in SMART attributes before. Is it anything to be concerned about? Thanks for the help.
February 18, 201115 yr Hi Guys, I precleared my first Hitachi 5K3000 drive (3 cycles) and got the following results: ** Changed attributes in files: /tmp/smart_start_sdi /tmp/smart_finish_sdi ATTRIBUTE NEW_VAL OLD_VAL FAILURE_THRESHOLD STATUS RAW_VALUE Temperature_Celsius = 206 253 0 ok 29 No SMART attributes are FAILING_NOW 0 sectors were pending re-allocation before the start of the preclear. 0 sectors are pending re-allocation at the end of the preclear, the number of sectors pending re-allocation did not change. 0 sectors had been re-allocated before the start of the preclear. 0 sectors are re-allocated at the end of the preclear, the number of sectors re-allocated did not change. ============================================================================ ============================================================================ The temp never went above 30 degrees C, that I saw. I don't remember seeing that change in SMART attributes before. Is it anything to be concerned about? Thanks for the help. Its fine, nothing to worry about. I just finished 3 cycles each on 2 drives and my results were almost identical.
February 19, 201115 yr I figure nothing to worry about but figured I would ask the experts. I got these off ebay used and real cheap. So here are the terminal outputs from four drives. Attached are the Smart Reports. Thank you guys ** Changed attributes in files: /tmp/smart_start_sdc /tmp/smart_finish_sdc ATTRIBUTE NEW_VAL OLD_VAL FAILURE_THRESHOLD STATUS RAW_VALUE Spin_Retry_Count = 100 100 97 near_thresh 0 Airflow_Temperature_Cel = 68 72 45 near_thresh 32 Temperature_Celsius = 32 28 0 ok 32 Hardware_ECC_Recovered = 87 99 0 ok 242522401 No SMART attributes are FAILING_NOW 0 sectors were pending re-allocation before the start of the preclear. 0 sectors are pending re-allocation at the end of the preclear, the number of sectors pending re-allocation did not change. 0 sectors had been re-allocated before the start of the preclear. 0 sectors are re-allocated at the end of the preclear, the number of sectors re-allocated did not change. ** Changed attributes in files: /tmp/smart_start_hda /tmp/smart_finish_hda ATTRIBUTE NEW_VAL OLD_VAL FAILURE_THRESHOLD STATUS RAW_VALUE Seek_Error_Rate = 75 74 30 ok 29469679 Spin_Retry_Count = 100 100 97 near_thresh 0 Airflow_Temperature_Cel = 70 73 45 near_thresh 30 Temperature_Celsius = 30 27 0 ok 30 Hardware_ECC_Recovered = 87 83 0 ok 33006651 No SMART attributes are FAILING_NOW 0 sectors were pending re-allocation before the start of the preclear. 0 sectors are pending re-allocation at the end of the preclear, the number of sectors pending re-allocation did not change. 0 sectors had been re-allocated before the start of the preclear. 0 sectors are re-allocated at the end of the preclear, the number of sectors re-allocated did not change. ** Changed attributes in files: /tmp/smart_start_sdd /tmp/smart_finish_sdd ATTRIBUTE NEW_VAL OLD_VAL FAILURE_THRESHOLD STATUS RAW_VALUE Airflow_Temperature_Cel = 71 71 45 In_the_past 29 No SMART attributes are FAILING_NOW 0 sectors were pending re-allocation before the start of the preclear. 0 sectors are pending re-allocation at the end of the preclear, the number of sectors pending re-allocation did not change. 0 sectors had been re-allocated before the start of the preclear. 0 sectors are re-allocated at the end of the preclear, the number of sectors re-allocated did not change. ** Changed attributes in files: /tmp/smart_start_sdb /tmp/smart_finish_sdb ATTRIBUTE NEW_VAL OLD_VAL FAILURE_THRESHOLD STATUS RAW_VALUE Airflow_Temperature_Cel = 68 71 45 In_the_past 32 Temperature_Celsius = 115 118 0 ok 32 No SMART attributes are FAILING_NOW 0 sectors were pending re-allocation before the start of the preclear. 0 sectors are pending re-allocation at the end of the preclear, the number of sectors pending re-allocation did not change. 0 sectors had been re-allocated before the start of the preclear. 0 sectors are re-allocated at the end of the preclear, the number of sectors re-allocated did not change. smart_finish_hda.txt smart_finish_sdb.txt smart_finish_sdc.txt smart_finish_sdd.txt
February 19, 201115 yr Everything looks fine. Two of the drives ( sdb, sdd ) had been exposed to high temperatures at some point in the past. If you look at the finish report for them you'll see the normalized WORST value is below the FAILURE_THRESHOLD for that attribute on both of those drives. They probably were used without any fans or cooling. The temperature looks fine now. Joe L.
February 20, 201115 yr Would someone mind taking a look at these results for me? I've run this drive 3 times now (actually 4, but the 3rd time I was running it, my PC that I had the telnet session open on froze up during the post-read). The first two times, I saw increases in the number of re-allocated sectors -- and the 3rd time, it stayed the same, but I'm concerned about some of the other values: ========================================================================1.6 == ST31500341AS 9VS1S5Y6 == Disk /dev/sde has been successfully precleared == with a starting sector of 63 ============================================================================ ** Changed attributes in files: /tmp/smart_start_sde /tmp/smart_finish_sde ATTRIBUTE NEW_VAL OLD_VAL FAILURE_THRESHOLD STATUS RAW_VALUE Raw_Read_Error_Rate = 118 105 6 ok 190690543 Spin_Retry_Count = 100 100 97 near_thresh 1 End-to-End_Error = 100 100 99 near_thresh 0 High_Fly_Writes = 1 1 0 near_thresh 331 Airflow_Temperature_Cel = 66 67 45 In_the_past 34 Temperature_Celsius = 34 33 0 ok 34 Hardware_ECC_Recovered = 57 53 0 ok 190690543 No SMART attributes are FAILING_NOW 0 sectors were pending re-allocation before the start of the preclear. 0 sectors were pending re-allocation after pre-read in cycle 1 of 1. 0 sectors were pending re-allocation after zero of disk in cycle 1 of 1. 0 sectors are pending re-allocation at the end of the preclear, the number of sectors pending re-allocation did not change. 133 sectors had been re-allocated before the start of the preclear. 133 sectors are re-allocated at the end of the preclear, the number of sectors re-allocated did not change. Should I be worried about the Raw_Read_Error_Rate, Spin_Retry_Count, End-to-End_Error, High_Fly_writes, etc? This drive came out of a Seagate External Enclosure, and it's been working fine for me for a while now, I just want to make absolutely sure before I put it in my array.
February 20, 201115 yr Would someone mind taking a look at these results for me? I've run this drive 3 times now (actually 4, but the 3rd time I was running it, my PC that I had the telnet session open on froze up during the post-read). The first two times, I saw increases in the number of re-allocated sectors -- and the 3rd time, it stayed the same, but I'm concerned about some of the other values: ========================================================================1.6 == ST31500341AS 9VS1S5Y6 == Disk /dev/sde has been successfully precleared == with a starting sector of 63 ============================================================================ ** Changed attributes in files: /tmp/smart_start_sde /tmp/smart_finish_sde ATTRIBUTE NEW_VAL OLD_VAL FAILURE_THRESHOLD STATUS RAW_VALUE Raw_Read_Error_Rate = 118 105 6 ok 190690543 Spin_Retry_Count = 100 100 97 near_thresh 1 End-to-End_Error = 100 100 99 near_thresh 0 High_Fly_Writes = 1 1 0 near_thresh 331 Airflow_Temperature_Cel = 66 67 45 In_the_past 34 Temperature_Celsius = 34 33 0 ok 34 Hardware_ECC_Recovered = 57 53 0 ok 190690543 No SMART attributes are FAILING_NOW 0 sectors were pending re-allocation before the start of the preclear. 0 sectors were pending re-allocation after pre-read in cycle 1 of 1. 0 sectors were pending re-allocation after zero of disk in cycle 1 of 1. 0 sectors are pending re-allocation at the end of the preclear, the number of sectors pending re-allocation did not change. 133 sectors had been re-allocated before the start of the preclear. 133 sectors are re-allocated at the end of the preclear, the number of sectors re-allocated did not change. Should I be worried about the Raw_Read_Error_Rate, Spin_Retry_Count, End-to-End_Error, High_Fly_writes, etc? No, the current VALUE is above the affiliated FAILURE_THRESHOLD. The manufacturer just happened to put the FAILURE_THRESHOLD at a value close the the normalized starting value on a few of the attributes. Only they know how many errors are actually needed to fail. (and they aren't telling) This drive came out of a Seagate External Enclosure, and it's been working fine for me for a while now, I just want to make absolutely sure before I put it in my array. I'm more concerned about the re-allocated sectors. If they've truly settled down, fine. If not, not so good. I've got one drive in my array with 100 re-allocated sectors and it has stayed that way no matter how many times I've pre-cleared it. It too was re-used from an old USB enclosure. All we know on your drive is it want through 1 cycle without re-allocation of any additional sectors, but the prior 2 re-allocated 133. My vote would be to preclear it for 2 or 3 more cycles, and if stable, use it. If it shows signs of re-allocating more sectors, RMA it. Joe L.
February 20, 201115 yr I'm more concerned about the re-allocated sectors. If they've truly settled down, fine. If not, not so good. I've got one drive in my array with 100 re-allocated sectors and it has stayed that way no matter how many times I've pre-cleared it. It too was re-used from an old USB enclosure. All we know on your drive is it want through 1 cycle without re-allocation of any additional sectors, but the prior 2 re-allocated 133. My vote would be to preclear it for 2 or 3 more cycles, and if stable, use it. If it shows signs of re-allocating more sectors, RMA it. Joe L. Thank you -- I think I will run a few more pre-clears on it just to make sure. The drive is fairly old, I'd have to go dig up some receipts to see if it's still under warranty (probably is, just need to make sure).
February 23, 201115 yr reusing an older F3 disk if I'm not mistaken its OK, no? preclear_rpt_sdd_2011-02-23 ========================================================================1.6 == invoked as: ./preclear_disk.sh /dev/sdd == SAMSUNG HD203WI S1UYJ1RZ508344== Disk /dev/sdd has been successfully precleared == with a starting sector of 64 == Ran 1 cycle == == Using :Read block size = 8225280 Bytes == Last Cycle's Pre Read Time : 8:12:44 (67 MB/s) == Last Cycle's Zeroing time : 7:57:10 (69 MB/s) == Last Cycle's Post Read Time : 16:20:37 (33 MB/s) == Last Cycle's Total Time : 32:31:57 == == Total Elapsed Time 32:31:57 == == Disk Start Temperature: 21C == == Current Disk Temperature: 27C, == ============================================================================ ** Changed attributes in files: /tmp/smart_start_sdd /tmp/smart_finish_sdd ATTRIBUTE NEW_VAL OLD_VAL FAILURE_THRESHOLD STATUS RAW_VALUE G-Sense_Error_Rate = 1 1 0 near_thresh 2110871 No SMART attributes are FAILING_NOW 0 sectors were pending re-allocation before the start of the preclear. 0 sectors were pending re-allocation after pre-read in cycle 1 of 1. 0 sectors were pending re-allocation after zero of disk in cycle 1 of 1. 0 sectors are pending re-allocation at the end of the preclear, the number of sectors pending re-allocation did not change. 0 sectors had been re-allocated before the start of the preclear. 0 sectors are re-allocated at the end of the preclear, the number of sectors re-allocated did not change. ============================================================================ preclear_finish_sdd_2011-02-23 Disk: /dev/sdd smartctl 5.39.1 2010-01-28 r3054 [i486-slackware-linux-gnu] (local build) Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Device Model: SAMSUNG HD203WI Serial Number: S1UYJ1RZ508344 Firmware Version: 1AN10003 User Capacity: 2,000,398,934,016 bytes Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 8 ATA Standard is: ATA-8-ACS revision 6 Local Time is: Wed Feb 23 03:29:58 2011 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (28200) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 255) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 252 2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0 3 Spin_Up_Time 0x0023 060 058 025 Pre-fail Always - 12353 4 Start_Stop_Count 0x0032 099 099 000 Old_age Always - 1629 5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0 8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 2168 10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 252 252 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 177 191 G-Sense_Error_Rate 0x0022 001 001 000 Old_age Always - 2110871 192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0 194 Temperature_Celsius 0x0002 064 045 000 Old_age Always - 27 (Lifetime Min/Max 12/55) 195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0 196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0036 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 17355 223 Load_Retry_Count 0x0032 252 252 000 Old_age Always - 0 225 Load_Cycle_Count 0x0032 099 099 000 Old_age Always - 11920 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Completed [00% left] (0-65535) 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. thanks in advance
February 23, 201115 yr reusing an older F3 disk if I'm not mistaken its OK, no? preclear_rpt_sdd_2011-02-23 ========================================================================1.6 == invoked as: ./preclear_disk.sh /dev/sdd == SAMSUNG HD203WI S1UYJ1RZ508344== Disk /dev/sdd has been successfully precleared == with a starting sector of 64 == Ran 1 cycle == == Using :Read block size = 8225280 Bytes == Last Cycle's Pre Read Time : 8:12:44 (67 MB/s) == Last Cycle's Zeroing time : 7:57:10 (69 MB/s) == Last Cycle's Post Read Time : 16:20:37 (33 MB/s) == Last Cycle's Total Time : 32:31:57 == == Total Elapsed Time 32:31:57 == == Disk Start Temperature: 21C == == Current Disk Temperature: 27C, == ============================================================================ ** Changed attributes in files: /tmp/smart_start_sdd /tmp/smart_finish_sdd ATTRIBUTE NEW_VAL OLD_VAL FAILURE_THRESHOLD STATUS RAW_VALUE G-Sense_Error_Rate = 1 1 0 near_thresh 2110871 No SMART attributes are FAILING_NOW 0 sectors were pending re-allocation before the start of the preclear. 0 sectors were pending re-allocation after pre-read in cycle 1 of 1. 0 sectors were pending re-allocation after zero of disk in cycle 1 of 1. 0 sectors are pending re-allocation at the end of the preclear, the number of sectors pending re-allocation did not change. 0 sectors had been re-allocated before the start of the preclear. 0 sectors are re-allocated at the end of the preclear, the number of sectors re-allocated did not change. ============================================================================ preclear_finish_sdd_2011-02-23 Disk: /dev/sdd smartctl 5.39.1 2010-01-28 r3054 [i486-slackware-linux-gnu] (local build) Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Device Model: SAMSUNG HD203WI Serial Number: S1UYJ1RZ508344 Firmware Version: 1AN10003 User Capacity: 2,000,398,934,016 bytes Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 8 ATA Standard is: ATA-8-ACS revision 6 Local Time is: Wed Feb 23 03:29:58 2011 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (28200) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 255) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 252 2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0 3 Spin_Up_Time 0x0023 060 058 025 Pre-fail Always - 12353 4 Start_Stop_Count 0x0032 099 099 000 Old_age Always - 1629 5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0 8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 2168 10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 252 252 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 177 191 G-Sense_Error_Rate 0x0022 001 001 000 Old_age Always - 2110871 192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0 194 Temperature_Celsius 0x0002 064 045 000 Old_age Always - 27 (Lifetime Min/Max 12/55) 195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0 196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0036 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 17355 223 Load_Retry_Count 0x0032 252 252 000 Old_age Always - 0 225 Load_Cycle_Count 0x0032 099 099 000 Old_age Always - 11920 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Completed [00% left] (0-65535) 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. thanks in advance Looks good to me too.
February 25, 201115 yr I just added a 3rd drive to my new unraid build. The first two drives cleared with no issues. I pulled an existing 2 tb drive from my PC that was working fine and tried running preclear. It got to about 97% on the pre-read and then froze at that point (hung for several hours). Initially I couldnt even kill the screen session. Anyways. I am trying to preclear again, however I get the following warning before running pre-clear. Is my drive toast? ################################################################## 1.6 Device Model: WDC WD20EARS-00MVWB0 Serial Number: WD-WCAZA Firmware Version: 51.0AB51 User Capacity: 2,000,398,934,016 bytes Disk /dev/sdc: 2000.3 GB, 2000398934016 bytes 255 heads, 63 sectors/track, 243201 cylinders, total 3907029168 sectors Units = sectors of 1 * 512 = 512 bytes Disk identifier: 0x00000000 Disk /dev/sdc doesn't contain a valid partition table ######################################################################## error: sdc is currently failing SMART tests. 1 Raw_Read_Error_Rate 0x002f 001 001 051 Pre-fail Always FAILING_NOW 40913 5 Reallocated_Sector_Ct 0x0033 133 133 140 Pre-fail Always FAILING_NOW 1265 Full SMART report is in /tmp/smart_start_sdc ######################################################################## invoked as ./preclear_disk.sh -M 4 /dev/sdc ######################################################################## (MBR unaligned set. Partition will start on sector 63) (it will not be 4k-aligned) Are you absolutely sure you want to clear this drive?
February 25, 201115 yr Anyways. I am trying to preclear again, however I get the following warning before running pre-clear. Is my drive toast? Yes, there are two SMART attributes that are FAILING_NOW. Be thankful you learned of the failure before you trusted the disk with your data. There are 1265 sectors that have been re-allocated. In highly technical terms, the drive is "toast." I see an RMA in your future. Joe L.
February 25, 201115 yr So I am doing a preclear on 5 Samsung F4's and I noticed something. It is on step 2 and running fine save for one thing. 4 of the 5 disks are chugging away at 104-106 MB/s the 5th one however is putzing at 23-25 MB/s Is he the runt of the litter?
February 25, 201115 yr So I am doing a preclear on 5 Samsung F4's and I noticed something. It is on step 2 and running fine save for one thing. 4 of the 5 disks are chugging away at 104-106 MB/s the 5th one however is putzing at 23-25 MB/s Is he the runt of the litter? Could be, or, you might have the SATA controller set to an IDE/Legacy compatibility mode. Joe L.
February 25, 201115 yr Hmmm, never changed anything in the BIOS, and all drives are conected to the MB SATA ports. Only thing I see as different about this drive is its port, all the others are sda, sdb, sdc, sdd and this one is hda. Kinda torked now too as my kid decided he wanted to play a game on the PC I had the Telnet sessions going on and rebooted the PC. Gotta start them all over now.
February 25, 201115 yr Hmmm, never changed anything in the BIOS, and all drives are conected to the MB SATA ports. Only thing I see as different about this drive is its port, all the others are sda, sdb, sdc, sdd and this one is hda. Kinda torked now too as my kid decided he wanted to play a game on the PC I had the Telnet sessions going on and rebooted the PC. Gotta start them all over now. if it is being shown as /dev/hda, then it is IDE emulation mode. The BIOS has options for this, and possibly two different options, one for the first 4 port, the other for the remaining 2 disk controller ports. The reason is simple, Windows-XP and prior have no SATA drivers. If there was not an IDE emulation mode, you could not boot those OS. Emulated IDE will usually be much slower than native SATA. You can change the emulation mode at any time. It will not affect the disk assignments in unRAID of affect the disk contents. Joe L.
February 25, 201115 yr Well, I stopped the current run of preclear and went into the BIOS to check and this is what it shows (* = current setting) OnChip SATA Channel -Enabled* Disabled OnChip SATA Type - Native IDE* RAID AHCI Legacy IDE IDE->AHCI SATA IDE Combined Mode - Enabled* Disabled SATA-III Mode - Auto* Force Max Gen2
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