Your wish is my command:
root@TestTower:~# smartctl -a -d ata /dev/sda
smartctl version 5.38 [i486-slackware-linux-gnu] Copyright (C) 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Caviar SE Serial ATA family
Device Model: WDC WD1200JD-75GBB0
Serial Number: WD-WMAET1372951
Firmware Version: 02.05D02
User Capacity: 120,000,000,000 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 6
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Mon Mar 8 10:40:48 2010 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 121) The previous self-test completed having
the read element of the test failed.
Total time to complete Offline
data collection: (3796) seconds.
Offline data collection
capabilities: (0x79) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 53) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 001 001 051 Pre-fail Always FAILING_NOW 31473
3 Spin_Up_Time 0x0007 146 144 021 Pre-fail Always - 3241
4 Start_Stop_Count 0x0032 100 100 040 Old_age Always - 388
5 Reallocated_Sector_Ct 0x0033 187 187 140 Pre-fail Always - 195
7 Seek_Error_Rate 0x000b 200 200 051 Pre-fail Always - 0
9 Power_On_Hours 0x0032 060 060 000 Old_age Always - 29218
10 Spin_Retry_Count 0x0013 100 100 051 Pre-fail Always - 0
11 Calibration_Retry_Count 0x0013 100 100 051 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 387
194 Temperature_Celsius 0x0022 107 253 000 Old_age Always - 43
196 Reallocated_Event_Count 0x0032 178 178 000 Old_age Always - 22
197 Current_Pending_Sector 0x0012 165 165 000 Old_age Always - 695
198 Offline_Uncorrectable 0x0012 176 176 000 Old_age Always - 485
199 UDMA_CRC_Error_Count 0x000a 200 253 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0009 134 155 051 Pre-fail Offline - 2136
SMART Error Log Version: 1
ATA Error Count: 27583 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 27583 occurred at disk power-on lifetime: 807 hours (33 days + 15 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 01 00 00 e0 Error:
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
00 00 c8 00 00 08 00 00 1d+09:48:57.450 NOP [Abort queued commands]
00 00 00 00 00 00 00 00 1d+09:48:57.450 NOP [Abort queued commands]
00 00 ef 00 00 45 00 00 1d+09:48:57.450 NOP [Abort queued commands]
00 00 00 00 00 00 00 00 1d+09:48:57.450 NOP [Abort queued commands]
Error 27582 occurred at disk power-on lifetime: 803 hours (33 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 ed 1d 4a e5 Error:
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
00 00 c8 00 00 08 00 00 1d+05:40:44.100 NOP [Abort queued commands]
00 00 00 00 00 00 00 00 1d+05:40:44.100 NOP [Abort queued commands]
00 00 ef 00 00 44 00 00 1d+05:40:44.100 NOP [Abort queued commands]
00 00 00 00 00 00 00 00 1d+05:40:44.100 NOP [Abort queued commands]
00 00 c8 00 00 08 00 00 1d+05:40:44.100 NOP [Abort queued commands]
Error 27581 occurred at disk power-on lifetime: 803 hours (33 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 ed 1d 4a e5 Error:
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
00 00 c8 00 00 08 00 00 1d+05:40:42.000 NOP [Abort queued commands]
00 00 00 00 00 00 00 00 1d+05:40:42.000 NOP [Abort queued commands]
00 00 ef 00 00 44 00 00 1d+05:40:42.000 NOP [Abort queued commands]
00 00 00 00 00 00 00 00 1d+05:40:42.000 NOP [Abort queued commands]
00 00 c8 00 00 08 00 00 1d+05:40:42.000 NOP [Abort queued commands]
Error 27580 occurred at disk power-on lifetime: 803 hours (33 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 ed 1d 4a e5 Error:
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
00 00 c8 00 00 08 00 00 1d+05:40:39.850 NOP [Abort queued commands]
00 00 00 00 00 00 00 00 1d+05:40:39.850 NOP [Abort queued commands]
00 00 ef 00 00 44 00 00 1d+05:40:39.850 NOP [Abort queued commands]
00 00 27 00 00 00 00 00 1d+05:40:39.850 NOP [Abort queued commands]
05 00 4a 00 00 e8 1d 00 1d+05:40:39.850 [RESERVED]
Error 27579 occurred at disk power-on lifetime: 803 hours (33 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 ed 1d 4a e5 Error:
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
00 00 c8 00 00 08 00 00 1d+05:40:37.750 NOP [Abort queued commands]
00 00 00 00 00 00 00 00 1d+05:40:37.750 NOP [Abort queued commands]
00 00 ef 00 00 44 00 00 1d+05:40:37.750 NOP [Abort queued commands]
00 00 00 00 00 00 00 00 1d+05:40:37.750 NOP [Abort queued commands]
00 00 c8 00 00 08 00 00 1d+05:40:37.750 NOP [Abort queued commands]
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed: read failure 90% 774 122951383
# 2 Short offline Completed without error 00% 430 -
# 3 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.